Wavelet analysis for the detection of parametric and catastrophic faults in mixed-signal circuits

AD Spyronasios, MG Dimopoulos… - IEEE Transactions on …, 2011 - ieeexplore.ieee.org
Methods for testing both parametric and catastrophic faults in analog and mixed-signal
circuits are presented. They are based on the wavelet transform (WT) of the measured …

A unified procedure for fault detection of analog and mixed-mode circuits using magnitude and phase components of the power supply current spectrum

DK Papakostas, AA Hatzopoulos - IEEE Transactions on …, 2008 - ieeexplore.ieee.org
A method using the power supply current for fault detection in analog and mixed-mode
circuits is presented. A new unified fault detection procedure is introduced, and its fault …

Hierarchical fault diagnosis of analog integrated circuits

CK Ho, PR Shepherd, F Eberhardt… - IEEE Transactions on …, 2001 - ieeexplore.ieee.org
This paper introduces a hierarchical-fault-diagnosis algorithm as an aid to testing analog
and mixed signal circuits. The diagnosis approach is based on that introduced by Wey and …

基于输出电压和电源电流协同分析的故障诊断方法

马岚, 王厚军 - 仪器仪表学报, 2013 - cqvip.com
提出了基于输出电压和电源电流协同分析的模拟电路故障诊断新方法. 由于不同故障对输出电压
和电源电流谐波频谱的幅度和相位的敏感程度不同, 因此使用该方法可以有效地检测到灾难型 …

I/sub CCQ: a test method for analogue VLSI based on current monitoring

JPM van Lammeren - Digest of Papers IEEE International …, 1997 - ieeexplore.ieee.org
This paper introduces a test method for analogue (parts of) ICs that determines whether an
IC is good or not by measuring the currents flowing through its constituent circuits. The I/sub …

Wavelet energy-based testing using supply current measurements

MG Dimopoulos, AD Spyronasios, DK Papakostas… - IET science, measurement …, 2010 - IET
In this study a test method based on wavelet energy of the supply current measurements is
presented. The method has been utilised by a microcontroller-based versatile test system …

Analog IC fault diagnosis by means of supply current monitoring in test points selected evolutionarily

T Golonek, D Grzechca… - ICSES 2010 International …, 2010 - ieeexplore.ieee.org
This paper describes the technique dedicated to an analog integrated circuit testing by
means of supply current monitoring. The minimal set of test points, that allows to achieve the …

Circuit implementation of a supply current spectrum test method

MG Dimopoulos, AD Spyronasios… - IEEE Transactions …, 2010 - ieeexplore.ieee.org
A supply current spectrum test method is developed in this work, and its implementation
using measurements of various analog circuits is presented. Statistical data from fault-free …

Analogue fault detectability comparison between power supply current and output voltage magnitude and phase spectrum components

DK Papakostas, AA Hatzopoulos - Electronics Letters, 2004 - IET
A method using magnitude and phase spectrum components for fault detection of
catastrophic and parametric faults is presented. A procedure is developed, discrimination …

Detection of time-delay related faults using Fourier phase components of power supply current

DK Papakostas, AA Hatzopoulos - Electronics Letters, 2004 - search.proquest.com
In this paper, a new method using power supply current spectrum phase components for
fault detection in analogue and mixed mode circuits is presented. A procedure is introduced …