An integrated DFT solution for power reduction in scan test applications by low power gating scan cell
Shrinking technologies to deep sub-microns has raised demands for high quality testing.
However, excessive power during test application time serves as limiting factors for reliability …
However, excessive power during test application time serves as limiting factors for reliability …
New design of scan flip-flop to increase speed and reduce power consumption
In this paper, a novel low-power and high-speed pulse triggered scan flip-flop is presented,
in which short circuit current is controlled. Switching activity is decreased to reduce the …
in which short circuit current is controlled. Switching activity is decreased to reduce the …