J Wang, C Wang, S Zhao, H Li, L Ding… - IEEE Journal of …, 2023 - ieeexplore.ieee.org
Parallel-connected power device is an extensively applied solution in the industry to increase the current rating of the converter system. However, due to the undesired printed …
L Ding, R Song, S Zhao, J Wang… - IEEE Transactions on …, 2023 - ieeexplore.ieee.org
The failure caused by cumulative fatigue damage due to cyclical thermal stress is the dominant failure mode of power semiconductor devices, and it poses reliability concerns. In …
Silicon carbide (SiC) power devices have been extensively for high-power-density application scenarios. To increase the current rating, SiC devices are usually connected in …
H Zhu, S Hu, M Tahir, Y Bai… - IEEE Journal of Emerging …, 2023 - ieeexplore.ieee.org
With the growth of electric vehicles (EVs), developing high-power density bidirectional on- board chargers (OBCs) has become a research hotspot. The asymmetric CLLC is one of the …
Z Lin-Qing, M Wan-Qing, W Xiao-Li, D Jing-Yi… - …, 2023 - search.proquest.com
Abstract β-Ga 2 O 3, with excellent bandgap, breakdown field, and thermal stability properties, is considered to be one of the most promising candidates for power devices …
M Zhang, H Li, Z Yang, S Zhao… - IEEE Transactions on …, 2024 - ieeexplore.ieee.org
With the fabulous growth of the renewable energy industry, silicon carbide (SiC) metal-oxide- semiconductor field-effect transistors (MOSFETs) are increasingly finding applications in …
R Yu, S Jahdi, P Mellor - IEEE Transactions on Industrial …, 2024 - ieeexplore.ieee.org
The intrinsic parameter disparities between silicon carbide (SiC) metal oxide semiconductor field effect transistors (MOSFETs) in the same phase leg can lead to variations in …
J Zhang, L Wang, S Xiong, Y Liu… - … on Power Electronics, 2024 - ieeexplore.ieee.org
The safe operation and lifetime of the power module are heavily dependent on the temperature distribution, making it imperative to optimize the thermal performance of the …
S Lu, L Wu, J Deng, S Li, J Xia… - IEEE Transactions on …, 2024 - ieeexplore.ieee.org
The parallel connection of silicon carbide (SiC)-mosfet modules can effectively increase the rated current of modules, however, the related current imbalance issue will affect the …