Non-metal to metal transition in n-type ZnO single crystal materials
S Brochen, G Feuillet, JL Santailler, R Obrecht… - Journal of Applied …, 2017 - pubs.aip.org
The electrical properties of ZnO mono-crystalline materials, either in the form of bulk crystals
or epitaxial films, were investigated for a large range of un-intentional or intentional doping …
or epitaxial films, were investigated for a large range of un-intentional or intentional doping …
Access to residual carrier concentration in ZnO nanowires by calibrated scanning spreading resistance microscopy
L Wang, JM Chauveau, R Brenier, V Sallet… - Applied Physics …, 2016 - pubs.aip.org
Scanning spreading resistance microscopy (SSRM) was performed on non-intentionally
doped (nid) ZnO nanowires (NWs) grown by metal-organic chemical vapor deposition in …
doped (nid) ZnO nanowires (NWs) grown by metal-organic chemical vapor deposition in …
Characterization of carrier concentration in ZnO nanowires by scanning capacitance microscopy
L Wang, S Guillemin, JM Chauveau… - … status solidi (c), 2016 - Wiley Online Library
Scanning capacitance microscopy (SCM) has been investigated on Ga doped ZnO staircase
multi‐layers grown by molecular beam epitaxy (MBE) and ZnO NWs grown by chemical bath …
multi‐layers grown by molecular beam epitaxy (MBE) and ZnO NWs grown by chemical bath …
Cross-section imaging and p-type doping assessment of ZnO/ZnO: Sb core-shell nanowires by scanning capacitance microscopy and scanning spreading resistance …
ZnO/ZnO: Sb core-shell structured nanowires (NWs) were grown by the metal organic
chemical vapor deposition method where the shell was doped with antimony (Sb) in an …
chemical vapor deposition method where the shell was doped with antimony (Sb) in an …
Investigation of tip-depletion-induced fail in scanning capacitance microscopy for the determination of carrier type
Scanning capacitance microscopy (SCM) was performed on an n-type Si multilayer structure
doped by phosphorus whose concentration ranges from 2× 10 17 to 2× 10 19 cm− 3. Three …
doped by phosphorus whose concentration ranges from 2× 10 17 to 2× 10 19 cm− 3. Three …
Resolving ZnO-based coaxial core-multishell heterostructure by electrical scanning probe microscopy
L Wang, C Sartel, S Hassani, V Sallet… - Applied Physics …, 2018 - pubs.aip.org
Coaxially periodic ZnO/ZnMgO core-multishell nanowire (NW) heterostructures were grown
via a metal organic chemical vapor deposition method. We investigated their electrical …
via a metal organic chemical vapor deposition method. We investigated their electrical …
[PDF][PDF] Scanning Probe Microscopy-Method Development and Applications to Zinc Oxide Structures
JA Borgersen - 2016 - duo.uio.no
Scanning spreading resistance microscopy (SSRM) and scanning capacitance microscopy
(SCM) are among the few techniques feasible for characterizing electrical properties on the …
(SCM) are among the few techniques feasible for characterizing electrical properties on the …