Noncontact potentiometry or scanning Kelvin probe microscopy (SKPM) is a widely used
technique to study charge injection and transport in (in) organic devices by measuring a …

Charge injection and accumulation in dielectrics are phenomena at the origin of different
kind of failure of devices. To improve the understanding of involved mechanisms, space …

We report the observation in the direct space of the transport of a few thousand charges
submitted to a tunable electric field along the surface of a silicon oxide layer. Charges are …

Charges injection and accumulation in the dielectric remains a critical issue, mainly because
these phenomena are involved in a great number of failure mechanisms in cables or …

Scanning probe microscopy (SPM) was used for studying the changes in topographical,
chemical, thermal and electrostatic properties of a styrene-butadiene latex coating as a …

Electric Force-Distance Curves (EFDC) is one of the ways whereby electrical charges
trapped at the surface of dielectric materials can be probed. To reach a quantitative analysis …

Techniques derived from the near-field microscopies and particularly the Atomic Force
Microscopy (AFM) are presented as alternative techniques for space charge measurement …

Electrostatic force microscopy (EFM) has become a powerful tool for investigating charges
on surfaces. The use of phase measurement in EFM is a direct and fast way to detect …

Previous studies have demonstrated that the electrostatic force distance curve (EFDC) is a
relevant way of probing injected charge in 3D. However, the EFDC needs a thorough …

Charges accumulation and injection in dielectric material remains critical because it is
related to a lot of applications or issues. A deep understanding of interfaces phenomena is …