Exploiting asymmetric errors for LDPC decoding optimization on 3D NAND flash memory

Q Li, L Shi, Y Cui, CJ Xue - IEEE Transactions on Computers, 2019 - ieeexplore.ieee.org
By stacking layers vertically, the adoption of 3D NAND has significantly increased the
capacity for storage systems. The complex structure of 3D NAND introduces more errors …

Improving LDPC performance via asymmetric sensing level placement on flash memory

Q Li, L Shi, CJ Xue, Q Zhuge… - 2017 22nd Asia and …, 2017 - ieeexplore.ieee.org
Flash memory development through technology scaling and bit density has significant
impact on the reliability of flash cells. Hence strong error correction code (ECC) schemes are …

Using error modes aware LDPC to improve decoding performance of 3-D TLC NAND flash

F Wu, M Zhang, Y Du, W Liu, Z Lu… - … on Computer-Aided …, 2019 - ieeexplore.ieee.org
3-D triple-level cell (3-D TLC) NAND flash has high storage density and capacity, but
degrading data reliability due to high raw bit error rates induced by a certain number of …

[PDF][PDF] Laldpc: Latency-aware ldpc for read performance improvement of solid state drives

Y Du, D Zou, Q Li, L Shi, H Jin, CJ Xue - Proc. MSST, 2017 - msstconference.org
High-density Solid State Drives (SSDs) have to use Low-Density Parity-Check (LDPC)
codes to store data reliably. Current LDPC implementations apply multiple read-retry steps …

P-Alloc: Process-variation tolerant reliability management for 3D charge-trapping flash memory

Y Wang, L Dong, R Mao - ACM Transactions on Embedded Computing …, 2017 - dl.acm.org
Three-dimensional (3D) flash memory is an emerging memory technology that enables a
number of improvements to conventional planar NAND flash memory, including larger …

Pair-bit errors aware LDPC decoding in MLC NAND flash memory

M Zhang, F Wu, Y Du, W Liu… - IEEE transactions on …, 2018 - ieeexplore.ieee.org
By storing multibit per cell, multilevel cell (MLC) NAND flash memory achieves high storage
capacity, but sacrificing data reliability. Error correction codes, such as Bose–Chaudhuri …

Heating dispersal for self-healing NAND flash memory

R Chen, Y Wang, D Liu, Z Shao… - IEEE Transactions on …, 2016 - ieeexplore.ieee.org
Substantially reduced lifetimes are becoming a critical issue in NAND flash memory with the
advent of multi-level cell and triple-level cell flash memory. Researchers discovered that …

Process Variation Aware Read Performance Improvement for LDPC-Based nand Flash Memory

Q Li, L Shi, Y Di, C Gao, C Ji, Y Liang… - IEEE Transactions on …, 2019 - ieeexplore.ieee.org
With the rapid development of technology scaling and cell density improvement for capacity
increase and cost reduction, nand flash memory is confronted with degraded reliability. On …

CooECC: A cooperative error correction scheme to reduce LDPC decoding latency in NAND flash

M Zhang, F Wu, Y Du, C Yang, C Xie… - 2017 IEEE International …, 2017 - ieeexplore.ieee.org
The storage capacity of NAND Flash has increased by scaling down to smaller cell size and
using multi-level storage technology, but data reliability is degraded by severer retention …

Invalid data-aware coding to enhance the read performance of high-density flash memories

W Choi, M Jung, M Kandemir - 2018 51st Annual IEEE/ACM …, 2018 - ieeexplore.ieee.org
High bit-density flash memories such as Multi-Level Cell (MLC) and Triple-Level Cell (TLC)
flash have become a norm, since doubling the cell bit-density can increase the storage …