Experimental Characterization & Electro-Thermal Modeling of Double Side Cooled SiC MOSFETs for Accurate and Rapid Power Converter Simulations

P Dini, S Saponara, S Chakraborty… - IEEE …, 2023 - ieeexplore.ieee.org
The paper presents a precise and efficient model of Double-Side Cooled (DSC) SiC
MOSFET, which incorporates the dynamics of both electrical and thermal variables. It offers …

Circuit-based electrothermal modeling of SiC power modules with nonlinear thermal models

S Race, A Philipp, M Nagel, T Ziemann… - IEEE transactions on …, 2022 - ieeexplore.ieee.org
Silicon carbide (SiC) power devices have the potential to operate at high temperatures
beyond the capabilities of silicon power devices. At increased temperatures, the temperature …

Reliability improvement of 3.3 kV full-SiC power modules for power cycling tests with sintered copper die attach technology

K Yasui, S Hayakawa, T Funaki - IEEE Transactions on …, 2023 - ieeexplore.ieee.org
Low conduction and switching loss silicon carbide power modules must be operated at
higher maximum junction temperatures utilizing their wide bandgap material properties. This …

Design for reliability of SiC multichip power modules: The effect of variability

S Race, T Ziemann… - … Devices and ICs …, 2021 - ieeexplore.ieee.org
The variability of the temperature-dependent on-state resistance, R dsON (T), of SiC power
MOSFETs can significantly affect the temperature distribution, and, hence, the lifetime of SiC …

Power cycling reliability of SiC MOSFETs in discrete and module packages

I Kovacevic-Badstuebner, S Race… - 2022 IEEE …, 2022 - ieeexplore.ieee.org
This paper presents an analysis of power cycling (PC) capabilities of two industry-standard
packages with silicon carbide power MOSFET dies: the discrete TO-247 package and a …

Investigation of Transient Two-Stage Thermal Equivalent RC Network of SOI-MOSFETs Using Nano Double-Pulse Measurement

Y Li, T Ni, J Wang, L Gao, X Li, J Li, J Bu… - … on Electron Devices, 2022 - ieeexplore.ieee.org
The self-heating effect (SHE) of silicon-on-insulator (SOI) MOSFETs brings challenges to the
measurement and modeling of transient electrothermal characteristics. For the first time, this …

[HTML][HTML] Chip packaging interaction of SiC junction barrier Schottky diode packages

SU Zhang, O Seok - Energy Reports, 2023 - Elsevier
Wide band gap semiconductors are attractive in the electric vehicle industry because of their
higher operating temperatures, and lower switching losses than those of silicon …

The Influence of Special Environments on SiC MOSFETs

Z Li, J Jiang, Z He, S Hu, Y Shi, Z Zhao, Y He, Y Chen… - Materials, 2023 - mdpi.com
In this work, the influences of special environments (hydrogen gas and high temperature,
high humidity environments) on the performance of three types of SiC MOSFETs are …

3-D electrothermal modeling of SiC multichip power modules for a more accurate reliability assessment

S Race, R Stark… - CIPS 2022; 12th …, 2022 - ieeexplore.ieee.org
This paper shows a 3-D electro-thermal FEM-based modeling of SiC multichip power
modules including the volume heat generation of SiC power MOSFET dies. Based on a …

Thermal analysis of SiC power semiconductor packages using the structure function

S Race, I Kovacevic-Badstuebner… - … Investigations of ICs …, 2021 - ieeexplore.ieee.org
This paper presents a comprehensive analysis on the information contained within the
structure functions of SiC power MOSFET packages, focusing on the regions of die and die …