Kalibrierfreie 3D-Rekonstruktion von gekrümmten Oberflächen mittels orthographischer Projektion unter Verwendung von Reflexionsmarkern

C Negara, T Längle, J Beyerer - tm-Technisches Messen, 2019 - degruyter.com
Die optische Vermessung gekrümmter Oberflächen erfolgt meist über problemspezifische
Messverfahren und Algorithmen zur 3D-Rekonstruktion, die an die optischen Eigenschaften …

[HTML][HTML] Wavelet filter bank optimization for classification of deflectometry measuring data

TT Le - Proceedings of the 2013 Joint Workshop of Fraunhofer …, 2014 - books.google.com
With the invention of the deflectometry, a method for defect detection and classification on
specular surface was presented. Even though several improvements took place in this field …

[HTML][HTML] Methods for multiscale evaluation of deflectometric measurements

M Ziebarth - Proceedings of the 2012 Joint Workshop of …, 2013 - books.google.com
The perception of defects on specular surfaces is highly dependent on the curvature of the
surface and the environment which is reflected in the surface. Flaws can be perceived as …

[HTML][HTML] Shape from Specular Reflection–Remarks on Shape Reconstruction and Experimental Design

S Werling - Fraunhofer IOSB and Institute for Anthropomatics …, 2009 - books.google.com
The main principle of shape from specular surface acquisition is to use a highly controllable
environment, where a screen on which a well-defined pattern is presented is observed via …

Moiré deflectometry under incoherent illumination: 3D profiler for specular surfaces

T Hirose, T Kitayama - Optical Measurement Systems for …, 2013 - spiedigitallibrary.org
We present a novel method for measuring a curved specular surface profile, which is the
moiré deflectometry under incoherent (white light) illumination. In our proposed system …

[PDF][PDF] Light Field Reconstruction using a Generic Imaging Model

D Uhlig, M Heizmann - M. Heizmann| T. Längle, 2020 - library.oapen.org
Light field cameras play an increasingly important role in computer vision and optical
metrology. However, due to their complex design, their calibration is very difficult and usually …

An extended architecture to optimize execution time of 3D image processing deflectometry algorithm using FPGA

F Bhatti, T Greiner, M Heizmann… - 2017 IEEE International …, 2017 - ieeexplore.ieee.org
The use of image processing is being accelerated over the past years in areas, including
artificial intelligence, medical field, remote sensing and microscopic imaging. For 3D …

Phase shift reflectometry for wafer inspection

K Peng, Y Cao, H Li, J Sun… - … on Optical and …, 2015 - spiedigitallibrary.org
In 3D measurement, specular surfaces can be reconstructed by phase shift reflectometry
and the system configuration is simple. In this paper, a wafer is measured for industrial …

A simple deflectometric method for measurement of Quasi-Plane specular surfaces

D Maestro-Watson, A Izaguirre… - … , Signals and their …, 2015 - ieeexplore.ieee.org
Deflectometric methods have been extensively used, both in research and industry, to
measure the shape of specular surfaces. The method presented in this paper makes it …

[PDF][PDF] Towards Efficient Deflectometry in Motion

A Pak - Fraunhofer IOSB and Institute for Anthropomatics …, 2013 - publica.fraunhofer.de
Despite years of research, the reliable shape reconstruction of highly specular objects is still
a largely unsolved problem, especially for complex objects or worse-than-ideal observation …