Characterizations on the doping of single-crystal silicon carbide

H Xiong, W Mao, R Wang, S Liu, N Zhang, L Song… - Materials Today …, 2022 - Elsevier
Due to its intriguingly electrical, thermal and optical characteristics, single-crystal silicon
carbide (SiC), one of the most significant wide-bandgap semiconductors, has been receiving …

Laser slicing of 4H-SiC wafers based on picosecond laser-induced micro-explosion via multiphoton processes

S Han, H Yu, C He, S Zhao, C Ning, L Jiang… - Optics & Laser …, 2022 - Elsevier
Silicon carbide has many advantages and a wide range of applications. The fabrication of a
thin silicon carbide wafer using diamond wire cutting has become problematic because it …

Formation of nitrogen-vacancy centers in 4H-SiC and their near infrared photoluminescence properties

S Sato, T Narahara, Y Abe, Y Hijikata… - Journal of Applied …, 2019 - pubs.aip.org
NCV Si− centers in SiC [nitrogen-vacancy (NV) centers], which produce near-infrared (NIR)
photoluminescence (PL) at room temperature, is expected to have applications as quantum …

4H-SiC wafer slicing by using femtosecond laser double-pulses

E Kim, Y Shimotsuma, M Sakakura… - Optical Materials …, 2017 - opg.optica.org
Silicon carbide (SiC) is promising as a key material for power electronics devices owing to
its wide bandgap property. Meanwhile, by the convention wire-saw technique, it is difficult to …

Vibrational–Electrical Properties Relationship in Donor-Doped TiO2 by Raman Spectroscopy

P Mazzolini, V Russo, CS Casari… - The Journal of …, 2016 - ACS Publications
Transparent conducting TiO2, obtained by Nb or Ta doping of the anatase structure, is
gaining increasing attention for the development of transparent electrodes. Usually …

Optical spectroscopy study of damage induced in 4H-SiC by swift heavy ion irradiation

S Sorieul, X Kerbiriou, JM Costantini… - Journal of Physics …, 2012 - iopscience.iop.org
Single crystals of 4H-SiC were irradiated with swift heavy ions (332 MeV Ti, 106 MeV Pb and
2.7 GeV U) in the electronic energy loss regime. The resulting damage was investigated with …

Controlled generation of photoemissive defects in 4H-SiC using swift heavy ion irradiation

A Chakravorty, B Singh, H Jatav, R Meena… - Journal of Applied …, 2021 - pubs.aip.org
Defects in SiC have shown tremendous capabilities for quantum technology-based
applications, making it necessary to achieve on-demand, high-concentration, and uniform …

Intense ionizing irradiation-induced atomic movement toward recrystallization in 4H-SiC

A Chakravorty, B Singh, H Jatav, S Ojha… - Journal of Applied …, 2020 - pubs.aip.org
An ultrafast thermal spike within a time interval of a few pico-seconds generated by intense
ionizing energy deposited using 100 MeV Ag ions is utilized to study the atomistic details of …

Relation between work function and structural properties of triangular defects in 4H-SiC epitaxial layer: Kelvin probe force microscopic and spectroscopic analyses

HK Kim, SI Kim, S Kim, NS Lee, HK Shin, CW Lee - Nanoscale, 2020 - pubs.rsc.org
To understand the relationship between the work function and structural properties of
sufficiently expanded triangular defects (size:∼ 250 μm) in the 4H-SiC epitaxial layer, Kelvin …

Exploring crystal recovery and dopant activation in coated laser annealing on ion implanted 4H–SiC epitaxial layers

C Calabretta, A Pecora, M Agati, A Muoio… - Materials Science in …, 2024 - Elsevier
In this work an extensive characterization over XeCl multishot laser irradiation was
performed at different energy densities and with different thicknesses of graphitic coating …