System Test and Diagnosis is the first book on test and diagnosis at the system level,
defined as any aggregation of related elements that together form an entity of sufficient …

US6073254A - Selectively accessing test access ports in a multiple test access port
environment - Google Patents US6073254A - Selectively accessing test access ports in a …

Most built-in self test (BIST) solutions require specialized test pattern generation hardware
which may introduce significant area overhead and performance degradation. Recently …

Design for testability in hardware-software systems - IEEE Design & Test of Computers Page 1
Design for Testability in Ha rdwa re-Softwa re Sys tern s CREATING TESTABLE designs is key …

Abstract IEEE 1149.1 Test Access Ports (TAPs) may be utilized at both IC and intellectual
property core design levels. TAPs serve as serial communication ports for accessing a …

A software product line can be seen as a process that can be used to implement a set of
software products that share common features [Nor01]. The resulting set of software …

The cost and complexity of mixed signal and analogue production test programs is lending
to considerable interest in Design for testability (DfT) techniques that have the potential to …

Recent advances in technology are leading to increases in the complexity and applications
of analogue and mixed-signal integrated circuits. This trend has been accompanied by an …

This paper proposes a roadmap for an embedded system test strategy that uses IEEE
Standard 1149.1 as a multidrop, addressable backplane test bus to provide test access by a …

An intermittent fault identification approach based on empirical mode decomposition (EMD)
and hidden Markov model (HMM) to restrain false alarm for built-in test (BIT) caused by …