A low power scan flip-flop cell includes a multiplexer, a master latch, a scan slave latch and
a data slave latch. The master latch is connected to the multiplexer, and used for generating …

Synchronizers play an essential role in multiple clock domain systems-on-chip. The most
common synchronizer consists of a series of pipelined flip-flops. Several factors influence …

The paper demonstrates the circuit of a low power D flip-flop serial in/parallel out (DFF SIPO)
based shift register design. The flip-flops (FF's) consumption of casual logic power in a SoC …

Power consumption in test becomes a higher barrier for consideration in test of any
combinational circuit is high during test mode as in its normal mode of functioning as …

Test power has been turned to a bottleneck for test considerations as the excessive power
dissipation has serious negative effects on chip reliability. In scan‐based designs, rippling …

An integrated circuit comprises scan test circuitry and additional circuitry subject to testing
utilizing the scan test circuitry. The scan test circuitry comprises at least one scan chain …

Shrinking technologies to deep sub-microns has raised demands for high quality testing.
However, excessive power during test application time serves as limiting factors for reliability …

Excessive power consumption during test application time has severely negative effects on
chip reliability since it has an inevitable role in hot spots that appear, degradation of …

An ultra-low power DFT architecture suitable for MIMO-OFDM applications & it was
introduced in this study. Several radix such as 8/16/32 dependent optimization methods are …

An integrated circuit comprises scan test circuitry and additional circuitry subject to testing
utilizing the scan test circuitry. The scan test circuitry comprises scan cells configured to form …