An approach to reduce surface charging with cryogenic plasma etching using hydrogen-fluoride contained gases

SN Hsiao, M Sekine, K Ishikawa, Y Iijima… - Applied Physics …, 2023 - pubs.aip.org
The surface conductivity influences the etched pattern profiles in the plasma process. In the
dielectric film etching, it is vital to reduce the charging build-up, which bends the trajectory of …

Asynchronously pulsed plasma for high aspect ratio nanoscale Si trench etch process

HJ Kim, GY Yeom - ACS Applied Nano Materials, 2023 - ACS Publications
The fabrication of high aspect ratio Si trenches has been becoming difficult due to the
decrease in critical dimension (CD) to deep nanoscale. Especially, aspect ratio dependent …

Modeling of microtrenching and bowing effects in nanoscale Si inductively coupled plasma etching process

Z Hu, H Shao, J Li, P Lai, W Wang, C Li… - Journal of Vacuum …, 2023 - pubs.aip.org
Plasma etching effects, such as microtrenching and bowing, negatively impact device
performance. Modeling of these effects at nanoscale is challenging, and theoretical and …

Enhancement of photosensitivity and stability of Sn-12 EUV resist by integrating photoactive nitrate anion

YK Kang, H Kim, SJ Lee, DS Oh, YH Yoon, CJ Kim… - Applied Surface …, 2024 - Elsevier
The semiconductor industry is currently transitioning to advanced extreme-ultraviolet
lithography (EUVL) to address the challenges facing the use of photolithography in …

Plasma atomic layer etching of ruthenium by oxygen adsorption-removal cyclic process

D San Kim, HI Kwon, YJ Jang, GC Kim, HS Gil… - Applied Surface …, 2024 - Elsevier
Ruthenium (Ru) is a next-generation metal interconnect material, and the demand for
precise etching is on the rise. This study explores anisotropic atomic layer etching (ALE) of …

[HTML][HTML] Bias-supply timing tailored to the aspect ratio dependence of silicon trench etching in Ar plasma with alternately injected C4F8 and SF6

T Yoshie, K Ishikawa, SN Hsiao, T Tsutsumi… - Applied Surface …, 2023 - Elsevier
In semiconductor device fabrication, the feature profiles of a high-aspect-ratio (HAR) Si
trench is needed to be controlled considering aspect-ratio-dependent etching (ARDE). This …

[HTML][HTML] Future of plasma etching for microelectronics: Challenges and opportunities

GS Oehrlein, SM Brandstadter, RL Bruce… - Journal of Vacuum …, 2024 - pubs.aip.org
Plasma etching is an essential semiconductor manufacturing technology required to enable
the current microelectronics industry. Along with lithographic patterning, thin-film formation …

Etched characteristics of nanoscale TiO2 using C4F8-based and BCl3-based gases

JW Hong, YH Kim, HJ Kim, HW Tak, SN Goong… - Materials Science in …, 2023 - Elsevier
TiO 2 is a material used in various fields such as electronics, optics, environment, etc. For
the application to electronic and optical devices, TiO 2 needs to be patterned using reactive …

50 Years of Reactive Ion Etching in Microelectronics

S Voronin, C Vallée - IEEE Transactions on Materials for …, 2024 - ieeexplore.ieee.org
In this short review, the evolution of plasma etching technologies used in microelectronics
fabrication since the discovery of the reactive ion etching process 50 years ago is explored …

Asynchronous pulse-modulated plasma effect on the generation of abnormal high-energetic electrons for the suppression of charge-up induced tilting and cell density …

H Kwon, F Iza, I Won, M Lee, S Han, R Park, Y Kim… - Physics of …, 2023 - pubs.aip.org
Asynchronous pulse-modulated plasma effect on the generation of abnormal high-energetic
electrons for the suppression of charge- Page 1 Asynchronous pulse-modulated plasma effect …