New structure transistors for advanced technology node CMOS ICs

Q Zhang, Y Zhang, Y Luo, H Yin - National Science Review, 2024 - academic.oup.com
Over recent decades, advancements in complementary metal-oxide-semiconductor
integrated circuits (ICs) have mainly relied on structural innovations in transistors. From …

Two-dimensional semiconductors and transistors for future integrated circuits

L Yin, R Cheng, J Ding, J Jiang, Y Hou, X Feng… - ACS …, 2024 - ACS Publications
Silicon transistors are approaching their physical limit, calling for the emergence of a
technological revolution. As the acknowledged ultimate version of transistor channels, 2D …

Toward monolithic growth integration of nanowire electronics in 3D architecture: a review

L Liang, R Hu, L Yu - Science China Information Sciences, 2023 - Springer
Abstract Quasi-one-dimensional (1D) semiconducting nanowires (NWs), with excellent
electrostatic control capability, are widely regarded as advantageous channels for the …

Investigating Nanowire, Nanosheet and Forksheet FET Hot-Carrier Reliability via TCAD Simulations

M Vandemaele, B Kaczer, E Bury… - 2023 IEEE …, 2023 - ieeexplore.ieee.org
We report TCAD simulation studies on nanowire (NW), nanosheet (NS) and forksheet (FS)
FET hot-carrier relia-bility. The simulations entail i) solving the Boltzmann transport equation …

[HTML][HTML] Radiation effects on multi-channel Forksheet-FET and Nanosheet-FET considering the bottom dielectric isolation scheme

G Choi, J Jeon - Nuclear Engineering and Technology, 2024 - Elsevier
This study analyzes the single-event transient (SET) characteristics of alpha particles on
multi-channel Forksheet-FET and Nanosheet-FET at the device and circuit levels through 3D …

1.3 EU Ships Act Drives Pan-European Full-Stack Innovation Partnerships

J De Boeck, JR Lèquepeys… - 2023 IEEE International …, 2023 - ieeexplore.ieee.org
In every aspect of our life and society, semiconductors play a major role and that impact is
set to increase even further. The pandemic in conjunction with supply chain hiccups and …

Reliability challenges in Forksheet Devices

E Bury, M Vandemaele, J Franco… - 2023 IEEE …, 2023 - ieeexplore.ieee.org
The forksheet (FSH) device architecture is a possible candidate towards continued logic cell
downscaling. It consists of vertically stacked n-and p-type sheets at opposing sides of a …

Complementary FET-The Future of the Semiconductor Transistor

SH Kim, SH Lee, WJ Lee, JW Park… - Electronics and …, 2023 - koreascience.kr
With semiconductor scaling approaching the physical limits, devices including CMOS
(complementary metal-oxide-semiconductor) components have managed to overcome yet …

Forksheet Field-Effect Transistors for Area Scaling and Gate-Drain Capacitance Reduction in Nanosheet-based CMOS Technologies

H Mertens, N Horiguchi - 2024 8th IEEE Electron Devices …, 2024 - ieeexplore.ieee.org
Nanosheet-based field-effect transistors with dielectric walls between adjacent devices,
referred to as forksheet transistors, can improve CMOS scaling by means of (1) space …

Effect of Si Separator in Forksheet FETs on Device Characteristics Investigated by Using In-House TCAD Process Emulator and Device Simulator

IK Kim, SC Han, G Park, GT Jang… - … on Simulation of …, 2023 - ieeexplore.ieee.org
In this work, we investigate the effect of a Si separator on the performance of a bottom
dielectric isolated (BDI) forksheet field effect transistor (FSFET) using our in-house TCAD …