Methods for testing both parametric and catastrophic faults in analog and mixed-signal
circuits are presented. They are based on the wavelet transform (WT) of the measured …

An analog fault diagnosis approach using a systematic step-by-step test is proposed for fault
detection and location in analog circuits with component tolerance and limited accessible …

Integrating analog circuits with the most advanced digitally-tuned processes increases the
defect rates and the risk of in-field wear out. Coupled with the reduced accessibility arising …

Although most of the integrated circuits in everyday applications surrounding us are digital,
analog electronic circuits are still necessary, since the real world is" analog" and our human …

The paper presents a practical technique of the analog circuits testing based on its supply
current waveform evaluation. The decision about an actual circuit under test state is made …

Integrating analog circuits with the most advanced digitally-tuned processes increases the
defect rates and the risk of in-field wearout. Coupled with the reduced accessibility arising …

Physical realization of momentous electronic circuit elements have becomes possible due to
the avant-garde integration technology. Such components are propitiously providing high …

In this paper a test method for testing both parametric and catastrophic faults in analog and
mixed signal Integrated Circuits (ICs) is presented. It is based on the wavelet transformation …

Dimension reduction of data is an important theme in the data processing and on the web to
represent and manipulate higher dimensional data. Rough set is fundamental and useful to …

Electronic circuits fault detection techniques, especially on modern mixed-signal circuits, are
evolved and customized around the world to meet the industry needs. The paper presents …