Conventional optics in the radio frequency (rf) through far-infrared (FIR) regime cannot
resolve microscopic features since resolution in the far field is limited by wavelength. With …

The need for ever-faster information processing requires exceptionally small devices that
operate at frequencies approaching the terahertz and petahertz regimes. For the diagnostics …

Mid-infrared nanoimaging and spectroscopy of two-dimensional (2D) materials have been
limited so far to scattering-type scanning near-field optical microscopy (s-SNOM) …

Near-field optical microscopy (NSOM) is a scanning probe technique that allows optical
imaging of sample surfaces with nanoscale resolution. Generally, all NSOM schemes rely on …

The rapid improvement in performance and increased density of electronic devices in
integrated circuits has provided a strong motivation for the development of contactless …

A novel approach for replacing mechanical probes used for wafer level testing with an
optical contactless method for the application and extraction of test vectors from advanced …

Electron-beam testing technique includes photoemissive probing; electrooptic sampling;
charge density probing and photoexcitation are analyzed. Among these techniques an ideal …

Quantum-dot cellular automata (QCA) is an emerging, promising, future generation
computational architecture that encodes binary information into the positions of electrons …

Organothiol self-assembled monolayers (SAMs) on Au (111) have been represented as
model membrane systems. The first project addresses the periodicity, defects, morphology …

Conventional microscopy is limited in resolution in all regimes of electromagnetic radiation
by diffraction. With the advent of near-field microscopy, resolution was extended in …