The error detecting and correcting codes are used in critical applications like in intensive
care units, defense applications, and require highly reliable data. This brief focuses on …

In recent years, there has been a growing interest in codes that can correct adjacent bit
errors in memories. This is due to the increasing percentage of radiation induced errors that …

As technology scales down, circuits are more prone to incur in faults and fault detection is
necessary to ensure the system reliability. However, fault‐detection circuits are also …

Single Event Transients (SETs) can be a major concern for combinational circuits. Its
importance grows as technology scales because a small charge can create a large …

As technology scales down, the semiconductor memories undergo radiation effects due to
congestion which may be recovered called as soft errors. This paper develops three …

As the feature sizes of integrated circuits are reduced to the nanometer scale, the total soft
error rate (SER) in memory and the proportion of multiple bit upsets (MBUs) are significantly …

In the last decade, a number of Single Error Correction Double Adjacent Error Correction
(SEC-DAEC) codes have been proposed to protect memories against Multiple Cell Upsets …