CS Lai, KJ Kanarik, S Tan, A Chandrashekar… - US Patent …, 2018 - Google Patents
US9972504B2 - Atomic layer etching of tungsten for enhanced tungsten deposition fill - Google Patents US9972504B2 - Atomic layer etching of tungsten for enhanced tungsten deposition fill …
J Yang, B Zhou, M Shen, T Lill, J Hoang - US Patent 9,870,899, 2018 - Google Patents
Methods of etching cobalt on substrates are provided. Some methods involve exposing the substrate to a boron-containing halide gas and an additive, and exposing the substrate to an …
S Tan, KIM Taeseung, W Yang, J Marks… - US Patent 9,806,252, 2017 - Google Patents
Methods of etching metal by depositing a material reactive with a metal to be etched and a halogen to form a volatile species and exposing the substrate to a halogen-containing gas …
S Tan, KIM Taeseung, W Yang, J Marks… - US Patent 10,374,144, 2019 - Google Patents
Methods of etching metal by depositing a material reactive with a metal to be etched and a halogen to form a volatile species and exposing the substrate to a halogen-containing gas …
P Agarwal, P Kumar, A Lavoie - US Patent 9,997,371, 2018 - Google Patents
Methods and apparatuses for patterning carbon-containing material over a layer to be etched are provided herein. Methods involve trimming carbon-containing material by atomic …
KJ Kanarik - US Patent 10,566,212, 2020 - Google Patents
Methods for evaluating synergy of modification and removal operations for a wide variety of materials to determine process conditions for self-limiting etching by atomic layer etching are …
A Lavoie, P Agarwal, P Kumar - US Patent 10,832,909, 2020 - Google Patents
Methods and apparatuses for patterning carbon-containing material over a layer to be etched are provided herein. Methods involve trimming carbon-containing material by atomic …
W Yang, S Tan, KJ Kanarik, J Marks… - US Patent …, 2018 - Google Patents
Provided herein are methods of atomic layer etching (ALE) of metals including tungsten (W) and cobalt (Co). The methods disclosed herein provide precise etch control down to the …
KJ Kanarik, J Marks, H Singh, S Tan… - US Patent …, 2019 - Google Patents
Methods are provided for integrating atomic layer etch and atomic layer deposition by performing both processes in the same chamber or reactor. Methods involve sequentially …