Optimization of overshoot in the pulsed radio frequency inductively coupled argon plasma by step waveform modulation

XY Lv, QZ Zhang, K Jiang, F Gao… - Journal of Applied Physics, 2023 - pubs.aip.org
The pulsed inductively coupled plasma (ICP) has considerable potential to satisfy multiple
stringent scaling requirements for use in the semiconductor industry. However, overshoot of …

Transients using low-high pulsed power in inductively coupled plasmas

C Qu, SK Nam, MJ Kushner - Plasma Sources Science and …, 2020 - iopscience.iop.org
Pulsed inductively coupled plasmas (ICPs) are widely deployed in the fabrication of
semiconductor devices. Pulse repetition frequencies of up to tens of kHz are commonly used …

Silicon etching in a pulsed HBr/O2 plasma. I. Ion flux and energy analysis

M Haass, M Darnon, G Cunge, O Joubert… - Journal of Vacuum …, 2015 - pubs.aip.org
The ion flux and ion velocity distribution function are studied using a capacitively coupled
radio frequency ion flux probe and a multigrid retarding field analyzer in an HBr/O 2 pulsed …

The plasma sheath around planar probes: effects of ion collisions

D Voloshin, T Rakhimova… - Plasma Sources Science …, 2016 - iopscience.iop.org
The 2D numerical model of the ion current collection by a planar probe has been developed
on the basis of a particle in cell with the Monte Carlo collision method for ion motion. This …

Patterning of silicon nitride for CMOS gate spacer technology. III. Investigation of synchronously pulsed CH3F/O2/He plasmas

R Blanc, F Leverd, M Darnon, G Cunge… - Journal of Vacuum …, 2014 - pubs.aip.org
Si 3 N 4 spacer etching processes are one of the most critical steps of transistor fabrication
technologies since they must be at the same time very anisotropic to generate straight …

Control of ion-flux and ion-energy in direct inductively coupled plasma reactor for interfacial-mixing plasma-enhanced atomic layer deposition

M Hirayama, A Teramoto, S Sugawa - Journal of Vacuum Science & …, 2020 - pubs.aip.org
The effects of low-energy (< 15 eV) high-flux O 2+ ion bombardment on the properties of Al 2
O 3 films deposited on 3D nanostructures by plasma-enhanced atomic layer deposition (PE …

Roughness generation during Si etching in Cl2 pulsed plasma

O Mourey, C Petit-Etienne, G Cunge… - Journal of Vacuum …, 2016 - pubs.aip.org
Pulsed plasmas are promising candidates to go beyond limitations of continuous waves'
plasma. However, their interaction with surfaces remains poorly understood. The authors …

A photodiode array and Langmuir probe for characterizing plasma in GLAST-III tokamak device

A Qayyum, F Deeba, MU Naseer, S Ahmad, MA Javed… - Measurement, 2018 - Elsevier
A newly developed spectroscopic system based on linear photodiodes array has been
installed on upgraded Glass Spherical Tokamak (GLAST-III) for spatial as well as temporal …

Spatio-temporal measurements of overshoot phenomenon in pulsed inductively coupled discharge

XY Lv, F Gao, QZ Zhang, YN Wang - Chinese Physics B, 2021 - iopscience.iop.org
Pulse inductively coupled plasma has been widely used in the microelectronics industry, but
the existence of overshoot phenomenon may affect the uniformity of plasma and generate …

Particle energy distributions and metastable atoms in transient low pressure interpulse microwave plasma

S Pandey, DN Patel, AR Baitha… - … Sources Science and …, 2015 - iopscience.iop.org
The electron energies and its distribution function are measured in non-equilibrium transient
pulsed microwave plasmas in the interpulse regime using a retarding field electron energy …