New structure transistors for advanced technology node CMOS ICs

Q Zhang, Y Zhang, Y Luo, H Yin - National Science Review, 2024 - academic.oup.com
Over recent decades, advancements in complementary metal-oxide-semiconductor
integrated circuits (ICs) have mainly relied on structural innovations in transistors. From …

Novel channel-first fishbone FETs with symmetrical threshold voltages and balanced driving currents using single work function metal process

L Cao, Q Zhang, Y Luo, J Gu, W Gan… - … on Electron Devices, 2022 - ieeexplore.ieee.org
In this article, one feasible fabrication approach for novel fishbone FETs using the channel-
first and single work function metal (sWFM) processes is proposed and investigated by 3-D …

Trench gate nanosheet FET to suppress leakage current from substrate parasitic channel

KS Lee, BD Yang, JY Park - IEEE Transactions on Electron …, 2023 - ieeexplore.ieee.org
Recently, nanosheet FETs (NS FETs) have been introduced as promising candidates for
beyond 3-nm node technology. However, difficulties remain for mass production of the NS …

[HTML][HTML] Investigation of Source/Drain Recess Engineering and Its Impacts on FinFET and GAA Nanosheet FET at 5 nm Node

D Wang, X Sun, T Liu, K Chen, J Yang, C Wu, M Xu… - Electronics, 2023 - mdpi.com
Impacts of source/drain (S/D) recess engineering on the device performance of both the gate-
all-around (GAA) nanosheet (NS) field-effect transistor (FET) and FinFET have been …

Impact of Gate Length and Doping Variation on the DC and Analog/RF Performance of sub - 3nm Stacked Si Gate-All-Around Nanosheet FET

N Yadav, S Jadav, G Saini - Silicon, 2023 - Springer
Abstract The nanosheet Field Effect Transistors (FETs) are the promising device architecture
for sub-5 nm technology node as per the International Roadmap for Devices and Systems …

[HTML][HTML] Gate electrostatic controllability enhancement in nanotube gate all around field effect transistor

L Qin, C Li, Y Wei, Z Xie, J He - AIP Advances, 2023 - pubs.aip.org
Recently, short channel effects (SCE) and power consumption dissipation problems impose
tremendous challenges that need imperative actions to be taken to deal with for field effect …

Double channeled nanotube gate all around field effect transistor with drive current boosted

L Qin, H Tian, C Li, Y Wei, J He, Y He, T Ren… - Microelectronic …, 2024 - Elsevier
Gate all around field effect transistor (GAAFET) presents a resurgence ascribed to its
enhanced gate electrostatic controllability by virtue of surrounding gate structure in coping …

[HTML][HTML] Leakage and Thermal Reliability Optimization of Stacked Nanosheet Field-Effect Transistors with SiC Layers

C Li, Y Shao, F Kuang, F Liu, Y Wang, X Li, Y Zhuang - Micromachines, 2024 - mdpi.com
In this work, we propose a SiC-NSFET structure that uses a PTS scheme only under the
gate, with SiC layers under the source and drain, to improve the leakage current and thermal …

Stacked Si Nanosheets Gate-All-Around Transistors with Silicon-on-Nothing Structure for Suppressing Parasitic Effects and Improving Circuits' Performance

L Li, L Cao, X Zhang, Q Li, M Zhang, Z Wu… - ECS Journal of Solid …, 2024 - iopscience.iop.org
We propose a novel silicon-on-nothing (SON) structure with an air sub-fin for suppressing
the parasitic channel effects on stacked Si nanosheets (NS) gate-all-around (GAA) …

A Comparative Review: Performance Parameters of Fin, Nanowire and Nanosheet Field Effect Transistors on 5nm Node

V Karutharaja, NB Balamurugan… - … on Devices, Circuits …, 2024 - ieeexplore.ieee.org
In this paper, a review is conducted on the novelties in the design, functionality, and
dependability of the suggested Gate All Around-Nanosheet Field Effect Transistors (GAA …