Usually, a medical record (MR) contains the patients' disease-oriented sensitive information.
In addition, the MR needs to be shared among different bodies, eg, diagnostic centres …

Scan is the de-facto standard for testing, which provides high observability and test
coverage by enabling direct access to chip memory elements. The scan-based Design-for …

Scan chain-based Design for Testability is the industry standard in use for testing
manufacturing defects in the semiconductor industry to ensure the structural and functional …

Scan-based Design for Testability (DfT) is the de-facto standard for detecting manufacturing-
related faults in chip manufacturing industries. The observability and accessibility provided …

Scan-based Design-for-testability (DfT) is the de facto standard in the semiconductor testing
industry to guarantee the functional and structural correctness of chips. It provides improved …

Scan-based Design for Testability (DfT) provides high fault coverage, observability, and
testability of internal nodes of the chip. It can serve as a medium for the attacker to launch a …

The IEEE Std 1687 (IJT AG) provides enhanced access to the on-chip test instruments,
which are included on the chip for test, post-silicon debug, in field maintenance, and …

With nearly 500 billion connected devices in 2025, information security will be the main
concern of the researchers. It is the driving force in developing resource efficient …

IoT is marked by the resource-constrained devices. Information security is the main
challenge that arise due to wireless transmission of data by ubiquitous sensors. The …

Scan based DfT is the de facto standard for testing the functional and structural correctness
of chips. It provides high observability and controllability of internal latches leading to …