[HTML][HTML] Effect of ion irradiation introduced by focused ion-beam milling on the mechanical behaviour of sub-micron-sized samples
The development of xenon plasma focused ion-beam (Xe+ PFIB) milling technique enables
site-specific sample preparation with milling rates several times larger than the conventional …
site-specific sample preparation with milling rates several times larger than the conventional …
[PDF][PDF] Effect of Ion Irradiation Introduced by Focused Ion-Beam Milling on the Mechanical Behaviour of Sub-Micron-Sized Samples
J Liu, R Niu, J Gu, M Cabral, M Song, X Liao - academia.edu
Methods The CrMnFeCoNi HEA with an equal atomic ratio for all five elements utilized in
this work was prepared by arc-melting of a mixture of pure metals (purity> 99.99 wt.%) in a Ti …
this work was prepared by arc-melting of a mixture of pure metals (purity> 99.99 wt.%) in a Ti …
Effect of Ion Irradiation Introduced by Focused Ion-Beam Milling on the Mechanical Behaviour of Sub-Micron-Sized Samples.
J Liu, R Niu, J Gu, M Cabral, M Song… - Scientific Reports, 2020 - search.ebscohost.com
The development of xenon plasma focused ion-beam (Xe< sup>+ PFIB) milling technique
enables site-specific sample preparation with milling rates several times larger than the …
enables site-specific sample preparation with milling rates several times larger than the …
[HTML][HTML] Effect of Ion Irradiation Introduced by Focused Ion-Beam Milling on the Mechanical Behaviour of Sub-Micron-Sized Samples
J Liu, R Niu, J Gu, M Cabral, M Song, X Liao - Scientific Reports, 2020 - ncbi.nlm.nih.gov
The development of xenon plasma focused ion-beam (Xe+ PFIB) milling technique enables
site-specific sample preparation with milling rates several times larger than the conventional …
site-specific sample preparation with milling rates several times larger than the conventional …
Effect of Ion Irradiation Introduced by Focused Ion-Beam Milling on the Mechanical Behaviour of Sub-Micron-Sized Samples.
J Liu, R Niu, J Gu, M Cabral, M Song, X Liao - Scientific Reports, 2020 - europepmc.org
The development of xenon plasma focused ion-beam (Xe+ PFIB) milling technique enables
site-specific sample preparation with milling rates several times larger than the conventional …
site-specific sample preparation with milling rates several times larger than the conventional …
Effect of Ion Irradiation Introduced by Focused Ion-Beam Milling on the Mechanical Behaviour of Sub-Micron-Sized Samples
J Liu, R Niu, J Gu, M Cabral, M Song… - Scientific …, 2020 - pubmed.ncbi.nlm.nih.gov
The development of xenon plasma focused ion-beam (Xe+ PFIB) milling technique enables
site-specific sample preparation with milling rates several times larger than the conventional …
site-specific sample preparation with milling rates several times larger than the conventional …
Effect of Ion Irradiation Introduced by Focused Ion-Beam Milling on the Mechanical Behaviour of Sub-Micron-Sized Samples
J Liu, R Niu, J Gu, M Cabral, M Song… - Scientific Reports, 2020 - ui.adsabs.harvard.edu
The development of xenon plasma focused ion-beam (Xe+ PFIB) milling technique enables
site-specific sample preparation with milling rates several times larger than the conventional …
site-specific sample preparation with milling rates several times larger than the conventional …
Effect of Ion Irradiation Introduced by Focused Ion-Beam Milling on the Mechanical Behaviour of Sub-Micron-Sized Samples.
J Liu, R Niu, J Gu, M Cabral, M Song, X Liao - Scientific Reports, 2020 - europepmc.org
The development of xenon plasma focused ion-beam (Xe+ PFIB) milling technique enables
site-specific sample preparation with milling rates several times larger than the conventional …
site-specific sample preparation with milling rates several times larger than the conventional …