Dynamic test set selection using implication-based on-chip diagnosis
2011 Sixteenth IEEE European Test Symposium, 2011 - ieeexplore.ieee.org
We propose using logic implications as a source of online diagnostic data for on-chip test set
selection by taking advantage of their ability to automatically identify a restricted set of faults …
selection by taking advantage of their ability to automatically identify a restricted set of faults …
Dynamic Test Set Selection Using Implication-Based On-Chip Diagnosis
N Alves, Y Shi, N Imbriglia, J Dworak, K Nepal… - Proceedings of the …, 2011 - dl.acm.org
We propose using logic implications as a source of online diagnostic data for on-chip test set
selection by taking advantage of their ability to automatically identify a restricted set of faults …
selection by taking advantage of their ability to automatically identify a restricted set of faults …
[PDF][PDF] Dynamic Test Set Selection Using Implication-Based On-Chip Diagnosis
N Alves, Y Shi, N Imbriglia, J Dworak, K Nepal… - scholar.archive.org
As circuits continue to scale to smaller feature sizes, wearout and latent defects are
expected to cause an increasing number of errors in the field. Online error detection …
expected to cause an increasing number of errors in the field. Online error detection …
Dynamic Test Set Selection Using Implication-Based On-Chip Diagnosis
N Alves, Y Shi, N Imbriglia, J Dworak… - 2011 16th IEEE …, 2011 - computer.org
With the advance of mobile technologies, it has been easier for mobile devices to support
collaborative activities. This opportunity brings about new possibilities to carry out mobile …
collaborative activities. This opportunity brings about new possibilities to carry out mobile …
Dynamic Test Set Selection Using Implication-Based On-Chip Diagnosis
N Alves, Y Shi, N Imbriglia, J Dworak, K Nepal… - 2011 Sixteenth IEEE … - infona.pl
We propose using logic implications as a source of online diagnostic data for on-chip test set
selection by taking advantage of their ability to automatically identify a restricted set of faults …
selection by taking advantage of their ability to automatically identify a restricted set of faults …
[引用][C] Dynamic Test Set Selection Using Implication-Based On-Chip Diagnosis
N Alves, Y Shi, N Imbriglia… - 2011 Sixteenth …, 2011 - researchonline.stthomas.edu
Abstract Arrays Electrical engineering Hardware Logic Implications Multicore processing on-
chip diagnosis Runtime System-on-a-chip Systematics test set selection
chip diagnosis Runtime System-on-a-chip Systematics test set selection