Electron beam induced current microscopy of silicon p–n junctions in a scanning transmission electron microscope

AP Conlan, G Moldovan, L Bruas, E Monroy… - Journal of Applied …, 2021 - pubs.aip.org
A silicon pn junction has been mapped using electron beam induced current in both a
scanning transmission electron microscope (STEM) and a conventional scanning electron …
被引用次数：11 相关文章

Electron beam induced current microscopy of silicon p–n junctions in a scanning transmission electron microscope

AP Conlan, G Moldovan, L Bruas, E Monroy… - Journal of Applied …, 2021 - pubs.aip.org
ABSTRACT A silicon pn junction has been mapped using electron beam induced current in
both a scanning transmission electron microscope (STEM) and a conventional scanning …

Electron beam induced current microscopy of silicon pn junctions in a scanning transmission electron microscope

AP Conlan, G Moldovan, L Bruas… - Journal of Applied …, 2021 - ui.adsabs.harvard.edu
A silicon pn junction has been mapped using electron beam induced current in both a
scanning transmission electron microscope (STEM) and a conventional scanning electron …

Electron beam induced current microscopy of silicon p–n junctions in a scanning transmission electron microscope

A Conlan, G Moldovan, L Bruas, E Monroy… - Journal of Applied …, 2021 - hal.science
A silicon pn junction has been mapped using electron beam induced current in both a
scanning transmission electron microscope (STEM) and a conventional scanning electron …