Atomic force microscopy for nanoscale mechanical property characterization
Over the past several decades, atomic force microscopy (AFM) has advanced from a
technique used primarily for surface topography imaging to one capable of characterizing a …
technique used primarily for surface topography imaging to one capable of characterizing a …
[引用][C] Atomic force microscopy for nanoscale mechanical property characterization
G Stan, SW King - Journal of Vacuum Science Technology B …, 2020 - ui.adsabs.harvard.edu
Atomic force microscopy for nanoscale mechanical property characterization - NASA/ADS Now on
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Atomic force microscopy for nanoscale mechanical property characterization
G Stan, S King - 2020 - nist.gov
Over the past several decades, atomic force microscopy (AFM) has advanced from a
technique used primarily for surface topography imaging to one capable of characterizing a …
technique used primarily for surface topography imaging to one capable of characterizing a …
Atomic force microscopy for nanoscale mechanical property characterization
G Stan, SW King - Journal of Vacuum Science & Technology B, 2020 - pubs.aip.org
Over the past several decades, atomic force microscopy (AFM) has advanced from a
technique used primarily for surface topography imaging to one capable of characterizing a …
technique used primarily for surface topography imaging to one capable of characterizing a …
[引用][C] Atomic force microscopy for nanoscale mechanical property characterization
G Stan, S King - 2020 - nist.gov