[HTML][HTML] Enhanced YOLOv8 with BiFPN-SimAM for Precise Defect Detection in Miniature Capacitors

N Li, T Ye, Z Zhou, C Gao, P Zhang - Applied Sciences, 2024 - mdpi.com
In the domain of automatic visual inspection for miniature capacitor quality control, the task
of accurately detecting defects presents a formidable challenge. This challenge stems …

Enhanced YOLOv8 with BiFPN-SimAM for Precise Defect Detection in Miniature Capacitors.

N Li, T Ye, Z Zhou, C Gao… - Applied Sciences (2076 …, 2024 - search.ebscohost.com
In the domain of automatic visual inspection for miniature capacitor quality control, the task
of accurately detecting defects presents a formidable challenge. This challenge stems …

Enhanced YOLOv8 with BiFPN-SimAM for Precise Defect Detection in Miniature Capacitors.

N Li, T Ye, Z Zhou, C Gao, P Zhang - Applied Sciences, 2024 - go.gale.com
In the domain of automatic visual inspection for miniature capacitor quality control, the task
of accurately detecting defects presents a formidable challenge. This challenge stems …