A technique for low power testing of VLSI chips

R Jayagowri, KS Gurumurthy - 2012 International Conference …, 2012 - ieeexplore.ieee.org
Power consumption of a circuit is more in test mode than normal mode. The increased heat
due to excess power dissipation can open up reliability issue due to electro-migration. In …
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A technique for low power testing of VLSI chips

R Jayagowri, KS Gurumurthy - … International Conference on Devices, Circuits and … - infona.pl
Power consumption of a circuit is more in test mode than normal mode. The increased heat
due to excess power dissipation can open up reliability issue due to electro-migration. In …