Exploiting test resource optimization in data path synthesis for BIST

X Li - Proceedings Ninth Great Lakes Symposium on VLSI, 1999 - ieeexplore.ieee.org
Area and test time are two major overheads encountered during data path synthesis for
BIST. This paper presents an attempt towards testability enhancement in data path BIST …
被引用次数：2 相关文章

Exploiting Test Resource Optimization in Data Path Synthesis for BIST

X Li, PYS Cheung - Great Lakes Symposium on VLSI, 1999 - computer.org
Currently, there are many problems of the application development of E-Assessment such
as the difficulty to use the assessment object from a platform to another one. In addition, the …

Exploiting test resource optimization in data path synthesis for BIST

X Li, P Cheung - Proceedings of the IEEE Great Lakes Symposium on …, 1999 - hub.hku.hk
Area and test time are two major overheads encountered during data path synthesis for
BIST. This paper presents an attempt towards testability enhancement in data path BIST …

Exploiting Test Resource Optimization in Data Path Synthesis for BIST

X Li, PYS Cheung - Proceedings of the Ninth Great Lakes Symposium …, 1999 - dl.acm.org
Area and test time are two major overheads encountered during data path synthesis for
BIST. This paper presents an attempt towards testability enhancement in data path BIST …