Deep learning library testing via effective model generation

Z Wang, M Yan, J Chen, S Liu, D Zhang - … of the 28th ACM Joint Meeting …, 2020 - dl.acm.org
Deep learning (DL) techniques are rapidly developed and have been widely adopted in
practice. However, similar to traditional software systems, DL systems also contain bugs …
被引用次数：125 相关文章
[PDF] github.io

[PDF][PDF] Deep Learning Library Testing via Effective Model Generation

Z Wang, M Yan, J Chen, S Liu, D Zhang - 2020 - tjusail.github.io
Deep learning (DL) techniques are rapidly developed and have been widely adopted in
practice. However, similar to traditional software, DL systems also contain bugs, which could …
[PDF] illinois.edu

[PDF][PDF] Deep Learning Library Testing via Effective Model Generation

Z Wang, M Yan, J Chen, S Liu, D Zhang - 2020 - lingming.cs.illinois.edu
Deep learning (DL) techniques are rapidly developed and have been widely adopted in
practice. However, similar to traditional software, DL systems also contain bugs, which could …
[PDF] illinois.edu

[PDF][PDF] Deep Learning Library Testing via Effective Model Generation

Z Wang, M Yan, J Chen, S Liu, D Zhang - 2020 - lingming.cs.illinois.edu
Deep learning (DL) techniques are rapidly developed and have been widely adopted in
practice. However, similar to traditional software, DL systems also contain bugs, which could …
[PDF] github.io

[PDF][PDF] Deep Learning Library Testing via Effective Model Generation

Z Wang, M Yan, J Chen, S Liu, D Zhang - 2020 - tjusail.github.io
Deep learning (DL) techniques are rapidly developed and have been widely adopted in
practice. However, similar to traditional software, DL systems also contain bugs, which could …