K Ono, N Nakazaki, H Tsuda… - Journal of Physics D …, 2017 - ui.adsabs.harvard.edu
Atomic-or nanometer-scale roughness on feature surfaces has become an important issue to be resolved in the fabrication of nanoscale devices in industry. Moreover, in some cases …
K Ono, N Nakazaki, H Tsuda, Y Takao… - Journal of Physics. D …, 2017 - inis.iaea.org
Surface morphology evolution during plasma etching of silicon..|INIS IAEA NUCLEUS Sign In Sign In Register Help 50+ years of INIS International Nuclear Information System International …