Lattice strain and defects analysis in nanostructured semiconductor materials and devices by high‐resolution X‐ray diffraction: theoretical and practical aspects

S Dolabella, A Borzì, A Dommann, A Neels - Small Methods, 2022 - Wiley Online Library
The reliability of semiconductor materials with electrical and optical properties are
connected to their structures. The elastic strain field and tilt analysis of the crystal lattice …
被引用次数：99 相关文章
[PDF] academia.edu

[PDF][PDF] Lattice Strain and Defects Analysis in Nanostructured Semiconductor Materials and Devices by High-Resolution X-Ray Diffraction: Theoretical and Practical …

S Dolabella, A Borzì, A Dommann, A Neels - Small, 2021 - academia.edu
Crystal lattice stress/strain, aging, degradation, and reliability are very important topics in
semiconductor materials and devices. In new semiconductor materials, stress/strain are …
[PDF] lib4ri.ch

[PDF][PDF] Lattice Strain and Defects Analysis in Nanostructured Semiconductor Materials and Devices by High-Resolution X-Ray Diffraction: Theoretical and Practical …

S Dolabella, A Borzì, A Dommann, A Neels - Small, 2022 - dora.lib4ri.ch
Crystal lattice stress/strain, aging, degradation, and reliability are very important topics in
semiconductor materials and devices. In new semiconductor materials, stress/strain are …

Lattice Strain and Defects Analysis in Nanostructured Semiconductor Materials and Devices by High-Resolution X-Ray Diffraction: Theoretical and Practical Aspects.

S Dolabella, A Borzì, A Dommann, A Neels - Small Methods, 2021 - europepmc.org
The reliability of semiconductor materials with electrical and optical properties are
connected to their structures. The elastic strain field and tilt analysis of the crystal lattice …
[PDF] archive.org

[PDF][PDF] Lattice Strain and Defects Analysis in Nanostructured Semiconductor Materials and Devices by High-Resolution X-Ray Diffraction: Theoretical and Practical …

S Dolabella, A Borzì, A Dommann, A Neels - Small, 2022 - scholar.archive.org
Crystal lattice stress/strain, aging, degradation, and reliability are very important topics in
semiconductor materials and devices. In new semiconductor materials, stress/strain are …

Lattice Strain and Defects Analysis in Nanostructured Semiconductor Materials and Devices by High-Resolution X-Ray Diffraction: Theoretical and Practical Aspects

S Dolabella, A Borzì, A Dommann… - Small …, 2022 - pubmed.ncbi.nlm.nih.gov
The reliability of semiconductor materials with electrical and optical properties are
connected to their structures. The elastic strain field and tilt analysis of the crystal lattice …