Scan power reduction through test data transition frequency analysis
Proceedings. International Test Conference, 2002 - ieeexplore.ieee.org
Significant reductions in test application times can be achieved through parallelizing core
tests; however, simultaneous test of various cores may result in exceeding power thresholds …
tests; however, simultaneous test of various cores may result in exceeding power thresholds …
[引用][C] Scan Power reduction Through Test Data Transition Frequency Analysis
O SINANOGLU - International Test Conference, 2002, 2002 - cir.nii.ac.jp
Scan Power reduction Through Test Data Transition Frequency Analysis | CiNii Research CiNii
国立情報学研究所 学術情報ナビゲータ[サイニィ] 詳細へ移動 検索フォームへ移動 論文・データを …
国立情報学研究所 学術情報ナビゲータ[サイニィ] 詳細へ移動 検索フォームへ移動 論文・データを …
[PDF][PDF] Scan Power Reduction Through Test Data Transition Frequency Analysis
O Sinanoglu, I Bayraktaroglu, A Orailoglu - academia.edu
Significant reductions in test application times can be achieved through parallelizing core
tests; however, simultaneous test of various cores may result in exceeding power thresholds …
tests; however, simultaneous test of various cores may result in exceeding power thresholds …
Scan Power Reduction Through Test Data Transition Frequency Analysis
O Sinanoglu, I Bayraktaroglu, A Orailoglu - Proceedings of the 2002 …, 2002 - dl.acm.org
Significant reductions in test application times can be achieved through parallelizing core
tests; however, simultaneous test of various cores may result in exceeding power thresholds …
tests; however, simultaneous test of various cores may result in exceeding power thresholds …
Scan power reduction through test data transition frequency analysis
O Sinanoglu, I Bayraktaroglu… - IEEE International Test …, 2002 - nyuscholars.nyu.edu
Significant reductions in test application times can be achieved through parallelizing core
tests; however, simultaneous test of various cores may result in exceeding power thresholds …
tests; however, simultaneous test of various cores may result in exceeding power thresholds …
Scan Power Reduction Through Test Data Transition Frequency Analysis
O Sinanoglu, I Bayraktaroglu… - Proceedings. International …, 2002 - computer.org
Significant reductions in test application times can be achieved through parallelizing core
tests; however, simultaneous test of various cores may result in exceeding power thresholds …
tests; however, simultaneous test of various cores may result in exceeding power thresholds …
[PDF][PDF] Scan Power Reduction Through Test Data Transition Frequency Analysis
O Sinanoglu, I Bayraktaroglu, A Orailoglu - scholar.archive.org
Significant reductions in test application times can be achieved through parallelizing core
tests; however, simultaneous test of various cores may result in exceeding power thresholds …
tests; however, simultaneous test of various cores may result in exceeding power thresholds …
[引用][C] Scan power reduction through test data transition frequency analysis
O SINANOGLU, I BAYRAKTAROGLU… - Proceedings …, 2002 - pascal-francis.inist.fr
Scan power reduction through test data transition frequency analysis CNRS Inist Pascal-Francis
CNRS Pascal and Francis Bibliographic Databases Simple search Advanced search Search …
CNRS Pascal and Francis Bibliographic Databases Simple search Advanced search Search …
[PDF][PDF] Scan Power Reduction Through Test Data Transition Frequency Analysis
O Sinanoglu, I Bayraktaroglu, A Orailoglu - cseweb.ucsd.edu
Significant reductions in test application times can be achieved through parallelizing core
tests; however, simultaneous test of various cores may result in exceeding power thresholds …
tests; however, simultaneous test of various cores may result in exceeding power thresholds …
[PDF][PDF] Scan Power Reduction Through Test Data Transition Frequency Analysis
O Sinanoglu, I Bayraktaroglu, A Orailoglu - cseweb.ucsd.edu
Significant reductions in test application times can be achieved through parallelizing core
tests; however, simultaneous test of various cores may result in exceeding power thresholds …
tests; however, simultaneous test of various cores may result in exceeding power thresholds …