Exploiting expendable process-margins in DRAMs for run-time performance optimization

K Chandrasekar, S Goossens, C Weis… - … , Automation & Test …, 2014 - ieeexplore.ieee.org
Manufacturing-time process (P) variations and runtime voltage (V) and temperature (T)
variations can affect a DRAM's performance severely. To counter these effects, DRAM …

[引用][C] Exploiting expendable process-margins in DRAMs for run-time performance optimization

K Chandrasekar, S Goossens, C Weis… - DATE'14, Dresden …, 2014 - research.tudelft.nl
Exploiting expendable process-margins in DRAMs for run-time performance optimization —
TU Delft Research Portal Skip to main navigation Skip to search Skip to main content TU Delft …

[PDF][PDF] Exploiting Expendable Process-Margins in DRAMs for Run-Time Performance Optimization

K Chandrasekar, S Goossens, C Weis, M Koedam… - Citeseer
Manufacturing-time process (P) variations and runtime voltage (V) and temperature (T)
variations can affect a DRAM's performance severely. To counter these effects, DRAM …

[PDF][PDF] Exploiting Expendable Process-Margins in DRAMs for Run-Time Performance Optimization

K Chandrasekar, S Goossens, C Weis, M Koedam… - es.ele.tue.nl
Manufacturing-time process (P) variations and runtime voltage (V) and temperature (T)
variations can affect a DRAM's performance severely. To counter these effects, DRAM …

Exploiting expendable process-margins in DRAMs for run-time performance optimization

K Chandrasekar, S Goossens, C Weis, M Koedam… - 2014 Design, Automation … - infona.pl
Manufacturing-time process (P) variations and runtime voltage (V) and temperature (T)
variations can affect a DRAM's performance severely. To counter these effects, DRAM …

[PDF][PDF] Exploiting Expendable Process-Margins in DRAMs for Run-Time Performance Optimization

K Chandrasekar, S Goossens, C Weis, M Koedam… - scholar.archive.org
Manufacturing-time process (P) variations and runtime voltage (V) and temperature (T)
variations can affect a DRAM's performance severely. To counter these effects, DRAM …

[PDF][PDF] Exploiting Expendable Process-Margins in DRAMs for Run-Time Performance Optimization

K Chandrasekar, S Goossens, C Weis, M Koedam… - date-conference.com
Manufacturing-time process (P) variations and runtime voltage (V) and temperature (T)
variations can affect a DRAM's performance severely. To counter these effects, DRAM …

Exploiting expendable process-margins in DRAMs for run-time performance optimizations

K Chandrasekar, SLM Goossens, C Weis… - … , Automation and Test …, 2014 - research.tue.nl
Manufacturing-time process (P) variations and runtime voltage (V) and temperature (T)
variations can affect a DRAM's performance severely. To counter these effects, DRAM …

Exploiting expendable process-margins in DRAMs for run-time performance optimization

K Chandrasekar, S Goossens, C Weis… - Proceedings of the …, 2014 - dl.acm.org
Manufacturing-time process (P) variations and run-time voltage (V) and temperature (T)
variations can affect a DRAM's performance severely. To counter these effects, DRAM …

[PDF][PDF] Exploiting Expendable Process-Margins in DRAMs for Run-Time Performance Optimization

K Chandrasekar, S Goossens, C Weis, M Koedam… - past.date-conference.com
Manufacturing-time process (P) variations and runtime voltage (V) and temperature (T)
variations can affect a DRAM's performance severely. To counter these effects, DRAM …