We describe a new technique that incorporates polarization modulation into near-field
scanning optical microscopy (NSOM) for nanometer scale polarimetry studies. By using this …

Near-field scanning optical microscopy (NSOM) is a new scanned probe microscopy
technique capable of combining high spatial resolution (10–100 nm) and optical contrast …

Scanning near-field optical microscopy SNOM or1, 2 is a versatile method to achieve high-
resolution optical images. By equipping such an instrument with a polarizationsensitive …

Scattering-type scanning near-field optical microscopy (s-SNOM) promises optical resolution
down to the 1 nm regime. In the present work, we develop a theoretical approach to probing …

Among the current goals in near-field scanning optical microscopy (NSOM) are the
improvements of spatial resolution as well as sensitivity to different types of optical …

We describe an aperture emission mode scanning near-field optical microscope (SNOM),
optimized for material surface science applications. This instrument can be operated in both …

This paper reviews the technique of apertureless near-field scanning optical microscopy
(ANSOM) and its use in mapping the inhomogeneous ferroelectric polarization in …

Polarization contrast scanning near-field optical microscopy (SNOM) provides information
on the orientation of molecules and molecular aggregates on surfaces. Other than in …

We present a polarization-sensitive full-field optical coherence microscopy modality which is
capable of simultaneously delivering depth resolved information on the reflectivity, optical …

Polarized light microscopy, as a contrast-enhancing technique for optically anisotropic
materials, is a method well suited for the investigation of a wide variety of effects in solid …