We address the optimal configuration of a partial Mueller matrix polarimeter used to
determine the ellipsometric parameters in the presence of additive Gaussian noise and …

We consider the Mueller matrix ellipsometry (MME) measuring the ellipsometric parameters
of the isotropic sample and the anisotropic sample under certain conditions in the presence …

In this paper, the close-form functions of estimation variances on the elements of the
measured Mueller matrix for a dual-rotating-retarder Mueller matrix polarimeter with a …

The accuracy of the Mueller polarimeter is usually affected by Gaussian–Poisson mixed
noise, and by optimizing the instrument matrices of polarization state generator and …

We present the theoretical and simulation results of the relationship between three input
states of polarization (SOP) and the Mueller matrix measurement error in an optical system …

Since the Mueller matrix ellipsometer has been used as a highly accurate tool for thin film
measurement, the error analysis and repeatability enhancement of such a tool are of great …

We investigate the optimal strategies for estimating the Mueller matrix with arbitrary numbers
of illumination and analysis states, in the presence of signal-independent additive noise or …

A 3× 3 Mueller matrix polarimeter, as one of the primary polarization measurement tools, has
attracted intensive interest in various fields of polarization optics. In this paper, from a novel …

For the measurement of Mueller matrix in an optical system with birefringence and small
polarization-dependent loss or gain (PDL/G), we theoretically derive the statistical …

We demonstrate that the ellipsometric parameters of the isotropic samples can be measured
by a partial polarimeter with only eight intensity measurements. Under the Gaussian and …