AI-assisted Design for Reliability: Review and Perspectives

C Yuan, SDM de Jong… - 2024 25th International …, 2024 - ieeexplore.ieee.org
The demand for rapid advancement in AI, mobile and automotive markets is pushing the
boundaries of electronic packaging, including heterogeneous integration, high-power …

Design for Reliability (DFR) Aware EDA Solution for Product Reliability

T Zhang, N Chang - 2024 IEEE International Reliability Physics …, 2024 - ieeexplore.ieee.org
Product reliability, encompassing both manufacturing and operational aspects, is emerging
as a crucial aspect of design across iterative chip-package-system design cycles, especially …

Leveraging Traditional Design for Reliability Techniques for Artificial Intelligence

B Werner, B Schumeg - 2022 Annual Reliability and …, 2022 - ieeexplore.ieee.org
Across academia, industry, and government there has been a resurgence of interest and
development of Artificial Intelligence (AI) as it emerges from a second winter. With advances …

The reliability prediction of electronic packages–an expert systems approach

N Gnanasambandam, A Primavera… - The International Journal of …, 2005 - Springer
The exponential growth of the electronics packaging industry has fueled the availability of a
variety of area array packages. The reliability of these packages, as characterized by their …

Correlation-driven machine learning for accelerated reliability assessment of solder joints in electronics

V Samavatian, M Fotuhi-Firuzabad, M Samavatian… - Scientific reports, 2020 - nature.com
The quantity and variety of parameters involved in the failure evolutions in solder joints
under a thermo-mechanical process directs the reliability assessment of electronic devices …

AI-assisted reliability life prediction model for wafer-level packaging using the random forest method

HY Hsiao, KN Chiang - Journal of Mechanics, 2020 - academic.oup.com
We applied an artificial intelligence (AI) algorithm, the random forest (RF) model, using finite
element simulations to predict the reliability life of wafer-level packaging (WLP). Due to rapid …

An overview of AI-Assisted design-on-Simulation technology for reliability life prediction of advanced packaging

SK Panigrahy, YC Tseng, BR Lai, KN Chiang - Materials, 2021 - mdpi.com
Several design parameters affect the reliability of wafer-level type advanced packaging,
such as upper and lower pad sizes, solder volume, buffer layer thickness, and chip …

Cross-layer design for reliability in advanced technology nodes: An EDA perspective

R Wang, Z Zhang, Z Sun, Z Guo, Y Lin… - 2022 IEEE 16th …, 2022 - ieeexplore.ieee.org
Design for reliability (DFR) in advanced technology nodes has become an increasingly
challenging task, which requires comprehensive support from aging-aware EDA tools and …

[图书][B] AI techniques for reliability prediction for electronic components

C Bhargava - 2019 - books.google.com
In the industry of manufacturing and design, one major constraint has been enhancing
operating performance using less time. As technology continues to advance, manufacturers …

Physics-based nested-ANN approach for fan-out wafer-level package reliability prediction

P Yao, J Yang, Y Zhang, X Fan, H Chen… - 2022 IEEE 72nd …, 2022 - ieeexplore.ieee.org
For the current electronic package simulation evaluation process, the main steps include
material characterization, data treatment and finite element modeling (FEM). In the workflow …