Transient pulses generated by high-energy particles can cause soft errors in circuits,
resulting in spacecraft malfunctions and posing serious threats to the normal operation of …

Radiation Hardened by Design (RHBD) is one of the main measures for solving the soft
error issue in digital circuits. However, a multi-objective optimization (MOO) problem …

Nanometer integrated circuits are getting increasingly vulnerable to soft errors and making
the soft error rate (SER) estimation an important challenge. In this study, a novel approach is …

Abstract Single Event Transient (SET) is a current and voltage disturbance in an integrated
circuit (IC), caused by charged particle impact. In modern IC technologies single charged …

Radiation-induced soft errors have posed an ever increasing reliability challenge as device
dimensions keep shrinking in advanced CMOS technology. Therefore, it is imperative to …

Nano-scale digital integrated circuits are getting increasingly vulnerable to soft errors due to
aggressive technology scaling. On the other hand, the impacts of process variations on …

Soft errors in combinational logic circuits are emerging as a significant reliability concern for
nanoscale VLSI designs. This paper presents a novel sensitivity-based gate sizing …

Technology scaling results in that the sensitivity of combinational circuits to soft errors and
negative bias temperature instability (NBTI) effect to circuits is becoming more and more …

This paper investigated the soft errors caused by particle strikes, such as high-energy
neutrons, extending beyond the deep submicrometer era. Considering the structure of the …

Purpose With continuous scaling of digital circuit CMOS technology, the vulnerability of
these circuits are significantly increasing against the soft errors. On the other hand, the …