Focused beams (electrons, ions, and photons) are at the forefront of today's and future
scientific and engineering advanced research instruments. The beams are typically used for …

Analysis by Electron Backscatter Diffraction (EBSD) requires that the sample surface be free
of deformation, oxidation and hydrocarbon contamination. The options for creating such a …

Three-dimensional electron backscatter diffraction (3D-EBSD) has emerged as a powerful
technique for generating 3D crystallographic information of a microstructure at the micro to …

One of the significant impediments to performing electron backscatter diffraction (EBSD) in
the SEM micro-or nanostructures is sample preparation. Traditional sample preparation …

The use of focused ion beam (FIB) systems, including lithographic applications, has
increased to a higher level in recent years [1]. The imaging, milling and deposition …

Xenon plasma focused ion beam (FIB) technology has the potential to investigate large
volumes, hundreds of micrometers in size whilst retaining the high resolution of SEM …

Considered as the newest field of electron microscopy, focused ion beam (FIB) technologies
are used in many fields of science for site-specific analysis, imaging, milling, deposition …

Specimen preparation for successful electron backscatter diffraction (EBSD) analyses is a
complex and multistage process. Because the EBSD signal comes from the top few …

Today's samples present many challenges for transmission electron microscope (TEM)
sample preparation. Focused ion beam (FIB) technology techniques continue to advance to …

Despite the significant advances in the transmission electron microscope (TEM), such as
application of aberration correction and monochromation [1], sample preparation is still one …