To engineer the next generation of advanced materials we must understand their
microstructure, and this requires microstructural characterization. This can be achieved …

Since the first automated electron backscatter diffraction (EBSD) results were attained 22
years ago, EBSD has become a common characterization technique in materials …

Electron backscatter diffraction (EBSD) is an SEM based technique used for the
characterization of microstructures, providing crystallographic information such as grain …

Orientation microscopy based on electron backscatter diffraction (EBSD) is a powerful
technique for the rapid and comprehensive characterization of crystalline materials. It covers …

A monolithic active pixel sensor based direct detector that is optimized for the primary beam
energies in scanning electron microscopes is implemented for electron back-scattered …

Electron backscatter diffraction (EBSD), or more precisely backscatter Kikuchi diffraction
(BKD), in the SEM enables individual grain orientations, local texture and point-to-point …

Recent developments in electron detection technology, particularly in pixelated
semiconductor detectors, enable the acquisition of electron diffraction patterns in various …

Electron backscatter diffraction (EBSD) is the principal technique used to obtain
crystallographic information in the scanning electron microscope (SEM). EBSD provides …

The ability to obtain microstructure-level orientation information, known generically as
microtexture, requires that the probe size available from the exploring radiation must be …

Electron backscatter diffraction is a scanning electron microscopy technique used to obtain
crystallographic information on materials. It allows the nondestructive mapping of crystal …