This paper presents a study of the parasitic emissions of a 0.18-/spl mu/m CMOS
experimental integrated circuit (IC) and an accurate method for modeling the internal current …

The electromagnetic emission of complex very large scale integrated circuits is determined
by their operation activity plus the manifold noise propagation paths through the on-chip …

This paper presents a full electromagnetic interference (EMI) study of high-performances 32-
bit microcontrollers (MCU). First, two types of standard radiated emissions measurements …

Advances in device technology are progressing at such a rate that the functionality of
integrated circuits (ICs) nearly doubles every year. The evolution of device technology has …

This work presents a new methodology to derive the equivalent circuit of the parasitic paths
that propagate switching noise in mixed-signals integrated circuits and that usually lead to …

Electromagnetic interference (EMI) issues are expected to be crucial for next-generation
system-on-package (SOP) integrated high-performance digital LSIs and for radio frequency …

Featured Application Inclusion of the electromagnetic compatibility analysis in the design
phase of the production flux of high-speed integrated circuits. Abstract This paper deals with …

This paper presents the results obtained with a specific test mask designed at Motorola for
the study of the electromagnetic parasitic emissions in integrated circuits (IC). First, origins of …

Total voltage sources and Thevenin equivalent circuits are derived by measurements and
simulations using IBIS models to characterize the conducted emissions from ICs. The …

Recent studies have shown that the aging of integrated circuits may modify electromagnetic
emission significantly. This paper reports on an experiment to elucidate the origins of …