Machine learning regression-based single-event transient modeling method for circuit-level simulation

C Xu, Y Liu, X Liao, J Cheng… - IEEE Transactions on …, 2021 - ieeexplore.ieee.org
In this article, a novel machine learning regression-based single-event transient (SET)
modeling method is proposed. The proposed method can obtain a reasonable and accurate …

Machine Learning-based model for Single Event Upset Current Prediction in 14nm FinFETs

V Vibhu, S Mittal, V Kumar - … on VLSI Design and 2023 22nd …, 2023 - ieeexplore.ieee.org
This work presents a machine learning regression-based surrogate model of Single Event
Upset (SEU) transient current for circuit-level simulation. The phenomenal success of …

An analytical model of single-event transients in double-gate MOSFET for circuit simulation

YM Aneesh, SR Sriram, KR Pasupathy… - IEEE Transactions on …, 2019 - ieeexplore.ieee.org
In this paper, a physics-based bias-dependent model of single-event transients (SETs) in
double-gate (DG) MOSFET suitable for circuit simulation is presented. The existing …

Hybrid data-driven modeling methodology for fast and accurate transient simulation of SiC MOSFETs

P Yang, W Ming, J Liang, I Lüdtke… - IEEE Transactions on …, 2021 - ieeexplore.ieee.org
To enable fast and accurate models of SiC MOSFETs for transient simulation, a hybrid data-
driven modeling methodology of SiC MOSFETs is proposed. Unlike conventional modeling …

A physics-based single event transient pulse width model for CMOS VLSI circuits

YM Aneesh, B Bindu - IEEE Transactions on Device and …, 2020 - ieeexplore.ieee.org
The single-event transients in MOSFETs due to heavy ion strikes introduce soft errors in sub-
50 nm CMOS VLSI circuits. These transients are easily captured and propagated in high …

Accurate modeling of single-event transients in a SiGe voltage reference circuit

KA Moen, L Najafizadeh, J Seungwoo… - … on Nuclear Science, 2011 - ieeexplore.ieee.org
Single-event transients (SETs) are modeled in a SiGe voltage reference using compact
model and full 3-D mixed-mode TCAD simulations. The effect of bias dependence and …

Real-time simulation of power electronic systems based on predictive behavior

C Liu, H Bai, S Zhuo, X Zhang, R Ma… - IEEE Transactions on …, 2019 - ieeexplore.ieee.org
The field-programmable gate array (FPGA) based hardware-in-the-loop (HiL) test, which
minimizes the time-step of the real-time simulation below 500 ns, is an enabling technology …

Discrete state event-driven framework with a flexible adaptive algorithm for simulation of power electronic systems

Y Zhu, Z Zhao, B Shi, Z Yu - IEEE Transactions on Power …, 2019 - ieeexplore.ieee.org
Accurate and efficient simulation of power electronic systems is challenging due to their
hybrid nature consisting of continuous states and discrete events. In this paper, a …

Modeling the dependence of single-event transients on strike location for circuit-level simulation

L Ding, W Chen, T Wang, R Chen, Y Luo… - … on Nuclear Science, 2019 - ieeexplore.ieee.org
The dependence of single-event transients on strike location is studied and integrated into
the bias-dependent single-event model for circuit simulation. Two nondimensional …

Electromagnetic transient modeling and simulation of power converters based on a piecewise generalized state space averaging method

L Wang, X Deng, P Han, X Qi, X Wu, M Li, H Xu - IEEE Access, 2019 - ieeexplore.ieee.org
Large-scale photovoltaic (PV) power plants connected to the grid leads to the complex
calculations in modeling and simulation of the power system, especially in the …