Peak broadening anisotropy and the contrast factor in metal alloys
TH Simm - Crystals, 2018 - mdpi.com
Diffraction peak profile analysis (DPPA) is a valuable method to understand the
microstructure and defects present in a crystalline material. Peak broadening anisotropy …
microstructure and defects present in a crystalline material. Peak broadening anisotropy …
Peak broadening anisotropy in deformed face-centred cubic and hexagonal close-packed alloys
TH Simm, PJ Withers… - Journal of Applied …, 2014 - journals.iucr.org
The broadening of diffraction peaks representing different families of grain orientations has
been measured for a number of deformed metals: austenitic stainless steel 316, nickel 200 …
been measured for a number of deformed metals: austenitic stainless steel 316, nickel 200 …
[图书][B] The use of diffraction peak profile analysis in studying the plastic deformation of metals
T Simm - 2013 - search.proquest.com
Abstract Analysis of the shapes of diffraction peak profiles (DPPA) is a widely used method
for characterising the microstructure of crystalline materials. The DPPA method can be used …
for characterising the microstructure of crystalline materials. The DPPA method can be used …
Determination of dislocation densities in HCP metals from X-ray diffraction line-broadening analysis
X-Ray diffraction (XRD) line-broadening analysis has been performed on highly textured Zr-
2.5 Nb specimens which had been deformed in tensile tests to produce well-controlled …
2.5 Nb specimens which had been deformed in tensile tests to produce well-controlled …
An evaluation of diffraction peak profile analysis (DPPA) methods to study plastically deformed metals
A range of diffraction peak profile analysis (DPPA) techniques were used to determine
details of the microstructure of plastically deformed alloys. Four different alloys were …
details of the microstructure of plastically deformed alloys. Four different alloys were …
Dislocation densities, arrangements and character from X-ray diffraction experiments
T Ungár - Materials Science and Engineering: A, 2001 - Elsevier
X-ray diffraction peak profile analysis has become a powerful tool during the last two
decades for the characterisation of microstructure either in the bulk or in loose powder …
decades for the characterisation of microstructure either in the bulk or in loose powder …
Whole diffraction pattern-fitting of polycrystalline fcc materials based on microstructure
A method is proposed for modelling the complete diffraction pattern of fcc polycrystalline
materials. The algorithm permits a simultaneous refinement of several parameters related to …
materials. The algorithm permits a simultaneous refinement of several parameters related to …
The convolutional multiple whole profile (CMWP) fitting method, a global optimization procedure for microstructure determination
The analysis of line broadening in X-ray and neutron diffraction patterns using profile
functions constructed on the basis of well-established physical principles and TEM …
functions constructed on the basis of well-established physical principles and TEM …
Validating classical line profile analyses using microbeam diffraction from individual dislocation cell walls and cell interiors
LE Levine, P Geantil, BC Larson… - Journal of Applied …, 2012 - journals.iucr.org
Dislocation structures in deformed metals produce broad asymmetric diffraction line profiles.
During analysis, these profiles are generally separated into two nearly symmetric subprofiles …
During analysis, these profiles are generally separated into two nearly symmetric subprofiles …
Defect-related physical-profile-based X-ray and neutron line profile analysis
Diffraction line broadening is caused by different defects present in crystalline materials:(1)
small coherent domains,(2) dislocations,(3) other types of microstrains,(4) twin …
small coherent domains,(2) dislocations,(3) other types of microstrains,(4) twin …