[HTML][HTML] Dependence of Ge/Si avalanche photodiode performance on the thickness and doping concentration of the multiplication and absorption layers

H Deeb, K Khomyakova, A Kokhanenko, R Douhan… - Inorganics, 2023 - mdpi.com
In this article, the performance and design considerations of the planar structure of
germanium on silicon avalanche photodiodes are presented. The dependences of the …

[PDF][PDF] Modeling Ge/Si avalanche photodiodes

F Gity, JM Hayes, B Corbett… - … European Conference on …, 2010 - researchgate.net
Ge/Si separate absorption, charge and multiplication avalanche photodiodes are
investigated. The influence of the absorption thickness and doping, along with the charge …

Germanium-tin on Si avalanche photodiode: device design and technology demonstration

Y Dong, W Wang, X Xu, X Gong, D Lei… - … on Electron Devices, 2014 - ieeexplore.ieee.org
We report the demonstration of a Ge 0.95 Sn 0.05 on silicon (Ge 0.95 Sn 0.05/Si) avalanche
photodiode (APD) having a separate-absorption-charge-multiplication structure, wherein a …

Effects of alloy composition on gain and bandwidth of Si/SiGe and Si/GeSn avalanche photodiodes

K Majumder, NR Das - Optik, 2016 - Elsevier
In this paper, effects of alloy composition (x or y) on gain and bandwidth of Si/Si 1− x Ge x
and Si/Ge 1− y Sn y heterostructure avalanche photodiodes (APDs) have been investigated …

Avalanche photodiode featuring Germanium-tin multiple quantum wells on silicon: Extending photodetection to wavelengths of 2 and beyond

Y Dong, W Wang, SY Lee, D Lei, X Gong… - 2015 IEEE …, 2015 - ieeexplore.ieee.org
We report the first demonstration of a Ge 0.9 Sn 0.1 multiple quantum wells on Si avalanche
photodiode (Ge 0.9 Sn 0.1 MQW/Si APD), achieving a cutoff wavelength λ above 2 μm. This …

Modeling the effects of interface traps on the static and dynamic characteristics of Ge/Si avalanche photodiodes

F Gity, JM Hayes, B Corbett… - IEEE Journal of …, 2011 - ieeexplore.ieee.org
The influence of interface donor and acceptor traps on the static and dynamic behavior of
Ge/Si separate absorption, charge, and multiplication avalanche photodiodes (APDs) is …

Buffer-free Ge/Si by rapid melting growth technique for separate absorption and multiplication avalanche photodetectors

CL Hsin, CH Chou - IEEE Electron Device Letters, 2019 - ieeexplore.ieee.org
Herein, we report the formation of buffer-free germanium (Ge) on silicon by a two-step rapid
melting growth technique for separate absorption and multiplication (SAM) avalanche …

[HTML][HTML] Research on the leakage current at sidewall of mesa Ge/Si avalanche photodiode

J Zhang, H Lin, M Liu, Y Yang - AIP Advances, 2021 - pubs.aip.org
The effects of surface defects at the sidewall of absorption and multiplication layers on the
sidewall leakage current in separate-absorption-charge-multiplication Ge/Si avalanche …

Design, fabrication, and characterization of InSb avalanche photodiode

J Abautret, A Evirgen, JP Perez… - Quantum Sensing …, 2014 - spiedigitallibrary.org
In this communication, the potentiality of InSb material as an avalanche photodiode (APD)
device is investigated. Current density-voltage (JV) characteristics at 77K of InSb pin …

Avalanche photodiode punch-through gain determination through excess noise analysis

HD Liu, H Pan, C Hu, D McIntosh, Z Lu… - Journal of Applied …, 2009 - pubs.aip.org
A new approach to determine the multiplication gain at punch-through for an avalanche
photodiode with separate absorption and multiplication regions from excess noise …