Semiconductor electronic and optoelectronic devices such as transistors, lasers, modulators,
and detectors are critical to the contemporary computing and communications infrastructure …

Electric potential probing on the nanometer scale elucidates the operation of actively driven
conducting, semiconducting, insulating and semi-insulating devices and systems. Spatial …

As the size of electronic devices continues to shrink, characterization methods capable of
precisely probing localized properties become increasingly important. Scanning probe …

Scanning force microscopy has been developed as a practical, non-contact probing
technique for measuring voltage waveforms at internal nodes of integrated devices and …

Following existing trends in microelectronic engineering scanning force microscope test
systems have been developed as a tool for sub micron device characterisation. Performance …

Electrostatic (EFM) and Kelvin probe force microscopy (KPFM) have contributed significantly
to the understanding of nanoscale electronic properties and the structure-property …

Scanning Probe Microscopy brings up to date a constantly growing knowledge base of
electrical and electromechanical characterization at the nanoscale. This comprehensive, two …

In the past two decades Atomic Force Microscopy (AFM) 1 has been recognized as a
powerful characterization method of surfaces at small scales and in different environments …

Several scanning probe microscopy (SPM) modes exist for the electrical characterization of
semiconductor materials and devices with nm-scale resolution. The most important electrical …

Knowledge on surface potential dynamics is crucial for understanding the performance of
modern-type nanoscale devices. We describe an electrical pump-probe approach in Kelvin …