Strain assisted inter-diffusion in GaN/AlN quantum dots

C Leclere, V Fellmann, C Bougerol, D Cooper… - Journal of Applied …, 2013 - pubs.aip.org
The structural and optical properties of high temperature-annealed superlattices of GaN
quantum dots embedded in AlN barrier have been studied by a combination of X-ray …

Influence of thermal annealing on the structural and optical properties of GaN/AlN quantum dots

M Peres, AJ Neves, T Monteiro… - … status solidi (b), 2010 - Wiley Online Library
The influence of the post‐growth thermal annealing on the structural and optical properties
of GaN/AlN quantum dots (QDs) is reported. X‐ray techniques suggest smooth and high …

Optical properties of Cubic GaN quantum dots grown by molecular beam epitaxy

S Blumenthal, D Reuter, DJ As - physica status solidi (b), 2018 - Wiley Online Library
We have investigated the optical properties of self‐assembled cubic GaN quantum dots
(QDs) in a cubic AlN matrix grown in Stranski–Krastanov growth mode. Two different sample …

Carrier localization in GaN/AlN quantum dots as revealed by three-dimensional multimicroscopy

L Mancini, F Moyon, D Hernàndez-Maldonado… - Nano …, 2017 - ACS Publications
The localization of carrier states in GaN/AlN self-assembled quantum dots (QDs) is studied
by correlative multimicroscopy relying on microphotoluminescence, electron tomography …

Effects of stacking on the structural and optical properties of self-organized GaN/AlN quantum dots

N Gogneau, F Fossard, E Monroy, S Monnoye… - Applied physics …, 2004 - pubs.aip.org
We report on the effect of vertical correlation on GaN/AlN quantum dots grown by plasma-
assisted molecular-beam epitaxy using the modified Stranski–Krastanow growth mode …

Mechanism of quantum dots capped with : An AFM, electron microscopy, and x-ray anomalous diffraction study

J Coraux, B Amstatt, JA Budagoski… - Physical Review B …, 2006 - APS
Capping of GaN quantum dots with AlN has been studied at the monolayer scale by
combining atomic force microscopy, high resolution electron microscopy, and grazing …

Quantitative characterization of GaN quantum-dot structures in AlN by high-resolution transmission electron microscopy

M Arlery, JL Rouviere, F Widmann, B Daudin… - Applied Physics …, 1999 - pubs.aip.org
GaN/AlN heterostructures grown by molecular beam epitaxy are studied by high-resolution
transmission electron microscopy (HRTEM). The two-dimensional/three-dimensional …

Phase separation in GaN/AlGaN quantum dots

M Benaissa, L Gu, M Korytov, T Huault… - Applied Physics …, 2009 - pubs.aip.org
Local investigations using high-angle annular-dark-field imaging combined with electron
low-energy-loss spectroscopy were performed to closely characterize the GaN/Al 0.5 Ga 0.5 …

Polarized emission from GaN/AlN quantum dots subject to uniaxial thermal interfacial stresses

O Moshe, DH Rich, B Damilano… - Journal of Vacuum Science …, 2010 - pubs.aip.org
The authors have studied the excitation-dependent optical properties of GaN/AlN self-
assembled quantum dots (QDs) grown on Si (111) substrates. Ensembles of QDs were …

Intraband spectroscopy of self-organized GaN/AlN quantum dots

A Helman, F Fossard, M Tchernycheva… - Physica E: Low …, 2003 - Elsevier
GaN/AlN quantum dots grown by molecular beam epitaxy either on silicon (111), sapphire or
6H–SiC (0001) substrate have been investigated using photoluminescence …