The availability of access to integrated circuits' scan chain is an inevitable requirement of
modern ICs for testability/debugging purposes. However, leaving open access to the scan …

The availability of access to Integrated Circuits' scan chain is an inevitable requirement of
modern ICs for testability/debugging purposes. However, leaving access to the scan chain …

Having access to the scan chain of Integrated Circuits (ICs) is an integral requirement of the
debug/testability process within the supply chain. However, the access to the scan chain …

The security of logic locking has been called into question by various attacks, especially a
Boolean satisfiability (SAT) based attack, that exploits scan access in a working chip. Among …

A novel technique to secure the scan chain of an integrated circuit (IC) is proposed. The
technique creates a logical partition between the functional and test modes of a circuit …

In this paper, we propose a new logic locking scheme to overcome scan-based side-
channel attacks. The scheme is implemented using parallel latches and a key that includes …

Logic locking has emerged as a promising solution to protect integrated circuits against
piracy and tampering. However, the security provided by existing logic locking techniques is …

The current trend to globalize the supply chain in the Integrated Circuits (ICs) industry has
raised several security concerns including, among others, IC overproduction. Over the past …

In this paper, we assess the security and testability of the state-of-the-art design-for-security
(DFS) architectures in the presence of scan-chain locking/obfuscation, a group of solution …

The current trend to globalize the supply chain in the Integrated Circuits (ICs) industry has
raised several security concerns including, among others, IC overproduction. Over the past …