Atomic force microscopy (AFM) is a key tool for nanotechnology research and finds its
principal application in the determination of surface topography. However, the use of the …

The combination of atomic force microscopy (AFM) and Kelvin probe technology is a
powerful tool to obtain high-resolution maps of the electric surface potential distribution on …

A conductive tip in an atomic force microscope (AFM) has extended the capability from
conventional topographic imaging to electrical surface characterization. The conductive tip …

The invention of scanning tunneling microscopy (STM), rapidly followed by atomic force
microscopy (AFM), occurred at the time when extensive research on sub-µm metal oxide …

The first book to summarize the applications of CAFM as the most important method in the
study of electronic properties of materials and devices at the nanoscale. To provide a global …

Atomic force microscopy (AFM) and scanning tunneling microscopy (STM) are well
established techniques to image surfaces and to probe material properties at the atomic and …

We used an ultrahigh-vacuum atomic force microscope (AFM) to measure lateral forces and
conductivity simultaneously as a function of the applied normal force for nanometer-sized …

We devised a method for the reliable electrical testing of nanoscale wire arrays using
conducting probe atomic force microscopy (AFM) in ambient conditions. A key requirement …

Reliable determination of the surface potential with spatial resolution is key for
understanding complex interfaces that range from nanostructured surfaces to molecular …

The availability of very sharp, wear-proof, electrically conductive probes is one crucial issue
for conductive atomic force microscopy (AFM) techniques such as scanning capacitance …