Overview of computational modeling in nano/micro scaled thin films mechanical properties and its applications

CC Lee, PC Huang - Computer Modeling in Engineering & …, 2019 - ingentaconnect.com
This research reviews the application of computational mechanics on the properties of
nano/micro scaled thin films, in which the application of different computational methods is …

Interfacial Stress Analyses of the Three Parameter Elastic Foundation Model for Mini-Led Chip-Uv Film Adhesive Structure and its Crack Propagation Experimental …

L Ma, Y Chen, Y Chen, M Hou, X Chen… - Available at SSRN … - papers.ssrn.com
The ultra-miniaturization trend of the chips presents new challenges for non-destructive
peeling-off techniques. This study models the mini-LED chip-UV film adhesive system as a …

Nano-indentation Test and Numerical Evaluation of Cu–Cr Interface Structure in Micro/Nano Manufacturing

P Yang, C Li, S Shang, L Zhang - Composite Interfaces, 2010 - Taylor & Francis
Interface design is an important topic in micro/nano electronic manufacturing. Interfaces of
dissimilar materials in micro/nano electronic manufacturing are prone to crack initiations …

[PDF][PDF] Preface: Nano/micro structures in application of computational mechanics

CC Lee, NT Tsou, TS Kim - CMES-COMPUTER MODELING IN …, 2019 - cdn.techscience.cn
Many important issues of structures, such as lattice mismatch, compatibility, orientation,
evolution, phase transition, surfaces, interfaces, defects, and domain engineering, have …

Determination of Optimal Material Combination for Multilayer Thin Films to Improve Performance Against Surface Crack Propagation

SD Bhamare - 2009 - rave.ohiolink.edu
Thin films have become technologically important in recent years. The mechanical
properties of a thin film affect its mechanical behavior and may lead to problems such as …

Fracture prediction of dissimilar thin film materials in Cu/low-k packaging

CC Lee, CC Lee, YW Yang - Journal of Materials Science: Materials in …, 2010 - Springer
For current semiconductor technology, interfacial crack in stacked thin films of Cu/low-k
damascene integration is a critical reliability issue that needs to be urgently resolved. In …

Adhesion investigation of low-k films system using 4-point bending test

CC Lee, J Huang, ST Chang, WC Wang - Thin Solid Films, 2009 - Elsevier
This research presents a simulation-based methodology to accurately predict interfacial
adhesion behaviors of heterostructures. Validation of the proposed approach is achieved …

[PDF][PDF] Crack and Delamination Risk Evaluation of Thin Silicon Based Microelectronics Devices

J Auersperg, D Vogel, B Michel - Topic, 2005 - researchgate.net
Enhancing miniaturization and system integration of microelectronics components demands
growingly for novel solutions toward embedding active and passive components into …

Patterned film effects on the adhesion of Al/TiN barrier using fracture-energy based finite element analysis

CC Lee - Surface and Coatings Technology, 2013 - Elsevier
The interfacial adhesion of thin films between Al metal and TiN barrier is one of the major
concerns dominating the mechanical reliability of semiconductor devices. The measured …

A multi-scale approach for investigation of interfacial delamination in electronic packages

HB Fan, MMF Yuen - Microelectronics Reliability, 2010 - Elsevier
Interfacial delamination, due to the presence of dissimilar material systems, is one of the
primary concerns in electronic package design. Continuum models such as J-integral have …