Variation in performance and power across manufactured parts and their operating
conditions is an accepted reality in modern microelectronic manufacturing processes with …

Parameter variations, which are increasing along with advances in process technologies,
affect both timing and power. Variability must be considered at both the circuit and …

Integrated circuits in modern systems-on-chip and microprocessors are typically operated
with sufficient timing margins to mitigate the impact of rising process, voltage, and …

Manufacturing and environmental variations cause timing errors in microelectronic
processors that are typically avoided by ultra-conservative multi-corner design margins or …

Process variations will significantly degrade the performance benefits of future
microprocessors as they move toward nanoscale technology. Device parameter fluctuations …

Process variations are poised to significantly degrade performance benefits sought by
moving to the next nanoscale technology node. Parameter fluctuations in devices can …

While Moore's law scaling continues to double transistor density every technology
generation, new design challenges are introduced. One of these challenges is variation …

Process variations are becoming of increasing importance in nanometer CMOS regime. This
paper reviews the challenges associated with variability and variation-tolerant design in …

Highly scaled technologies at and beyond the 22-nm node exhibit increased sensitivity to
various scaling-related problems that conspire to reduce the overall reliability of integrated …

Within-die parameter variation poses a major challenge to high-performance
microprocessor design, negatively impacting a processor's frequency and leakage power …