Deep level photorefractive spectroscopy of semiconductors

DD Nolte, DH Olson, AM GLASS - Quantum Electronics and Laser …, 1989 - opg.optica.org
Defect energy levels within the band gaps of semiconductor crystals can strongly influence
electronic and optical properties. While many techniques exist that can characterize and …

Bandgap and defect engineering for semiconductor holographic materials: Photorefractive quantum wells and thin films

D Nolte, M Melloch - MRS Bulletin, 1994 - cambridge.org
Bandgap engineering of thin semiconductor layers and defect engineering combine to form
photorefractive (PR) quantum well structures. PR quantum wells are semi-insulating thin …

Nonequilibrium screening of the photorefractive effect

DD Nolte, DH Olson, AM Glass - Physical review letters, 1989 - APS
The nonequilibrium occupation of multiple defect states in inhomogeneously illuminated
crystals is demonstrated to have dramatic and previously unexpected consequences for the …

Near-resonant photorefractive effects in bulk semiconductors

JE Millerd, EM Garmire, A Partovi - Photorefractive Effects and Materials, 1995 - Springer
In an effort to utilize photorefractives in practical applications, it is necessary to choose a
material on the basis of cost, performance, durability and operating parameters …

Photoreflectance characterization of semiconductors and semiconductor heterostructures

FH Pollak, H Shen - Journal of Electronic Materials, 1990 - Springer
The electromodulation method of photoreflectance (PR) is becoming an important tool for
the characterization of semiconductors, semiconductor interfaces and semiconductor …

Photoreflectance spectroscopy with white light pump beam

S Ghosh, BM Arora - Review of scientific instruments, 1998 - pubs.aip.org
Using a dual chopping scheme where both the pump beam and the probe beam are
chopped, we show that it is possible to perform photoreflectance spectroscopy with a …

[PDF][PDF] Photorefractive wave mixing in undoped LEC GaAs at 1.5 µm: validation of photorefractive modeling

P Delaye, LA de Montmorillon… - Applied …, 1994 - hal-iogs.archives-ouvertes.fr
We present photorefractive measurements in undoped GaAs performed at 1.06 pm, 1.32,
xm, and at u” 1.55, um. Using concentrations of EL2 that we determined through optical …

Photoreflectance spectroscopy applied to semiconductors and semiconductor heterostructures.

J Misiewicz, G Sęk, P Sitarek - Optica Applicata, 1999 - infona.pl
The photoreflectance spectroscopy is presented as a powerful tool for the characterisation of
semiconductor bulk and heterostructures. the advantages and possibilities offered by this …

Evaluation of photoelectric processes in photorefractive crystals via the exposure characteristics of light diffraction

A Kadys, V Gudelis, M Sudzius… - Journal of Physics …, 2004 - iopscience.iop.org
We demonstrate a novel way to analyse carrier recombination and transport processes in
photorefractive semiconductors via the exposure characteristics of light induced diffraction …

[引用][C] Elucidation of Photoreflectance Mechanisms by Phase Resolution Spectroscopy: Application to Delta‐Doped GaAs

VL Alperovich, AS Yaroshevich… - … status solidi (b), 1993 - Wiley Online Library
Photoreflectance (PR) spectroscopy proved to be very useful for the characterization of
various semiconductor structures [l to 61. In most cases PR can be considered as a …