With the rapid development of semiconductor technology, the reduction in device operating
voltage and threshold voltage has made integrated circuits more susceptible to the effects of …

Radiation-induced single event transients (SETs) are expected to evolve to single event
multiple transients (SEMTs) due to the downscaling of transistor feature size, which also …

The ever-expanding scale of integrated circuits has brought about a significant rise in the
design risks associated with radiation-resistant integrated circuit chips. Traditional single …

The aggressive scaling of nanometric VLSI technologies increases the integrated circuits
susceptibility to radiation, especially to single-event effects. Ordinarily, circuit vulnerability is …

Radiation susceptibility of electronics has always been about probing electrical properties in
either transient or time-accumulated phenomena. As the size and complexity of electronic …

The reliability of electronic circuits is subject to physical damage or functional failures due to
the influence of the application environment, such as the presence of atmospheric or space …

Research on the effects of radiation on advanced electronic devices and integrated circuits
has experienced rapid growth over the last few years, resulting in many approaches being …

The analysis and modeling of Single Event Transients (SETs) generated by particle
irradiation in digital integrated circuits (ICs), employ a mixed-mode approach which …

Radiation in space is potentially hazardous to microelectronic circuits and systems such as
spacecraft electronics. Transient effects on circuits and systems from high energetic particles …

The single event transients (SETs) are a common source of malfunction in nano-scale
CMOS integrated circuits. For this reason, evaluation of the SET effects and application of …